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Yoshiki Kida
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Saitama-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Exposure condition determination method, exposure method, exposure...
Patent number
9,239,524
Issue date
Jan 19, 2016
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus adjusting method, exposure apparatus, and device...
Patent number
9,025,126
Issue date
May 5, 2015
Nikon Corporation
Yosuke Shirata
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus, exposure method, and device producing method
Patent number
8,913,224
Issue date
Dec 16, 2014
Nixon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus, exposure method, and device producing method
Patent number
8,035,799
Issue date
Oct 11, 2011
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
NMR probe
Patent number
7,872,476
Issue date
Jan 18, 2011
Jeol Ltd.
Hiroshi Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
NMR probe
Patent number
7,714,579
Issue date
May 11, 2010
Jeol Ltd.
Hiroto Suematsu
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus, surface position adjustment unit, mask, and dev...
Patent number
6,900,880
Issue date
May 31, 2005
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Local signal-supplying device for NMR spectrometer
Patent number
6,680,611
Issue date
Jan 20, 2004
Jeol Ltd.
Yoshiki Kida
G01 - MEASURING TESTING
Information
Patent Grant
Substrate transport apparatus and method
Patent number
6,577,382
Issue date
Jun 10, 2003
Nikon Corporation
Yoshiki Kida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for positioning substrate
Patent number
6,400,445
Issue date
Jun 4, 2002
Nikon Corporation
Kenji Nishi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for positioning substrate
Patent number
6,225,012
Issue date
May 1, 2001
Nikon Corporation
Kenji Nishi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Position control method in exposure apparatus
Patent number
6,141,108
Issue date
Oct 31, 2000
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
FIRST HOLDING APPARATUS, THIRD HOLDING APPARATUS, FIFTH HOLDING APP...
Publication number
20240377763
Publication date
Nov 14, 2024
Nikon Corporation
Arata OCHINO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Exposure condition determination method, exposure method, exposure...
Publication number
20160124317
Publication date
May 5, 2016
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Exposure apparatus, exposure method, and device producing method
Publication number
20120026475
Publication date
Feb 2, 2012
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EXPOSURE CONDITION DETERMINATION METHOD, EXPOSURE METHOD, EXPOSURE...
Publication number
20100002206
Publication date
Jan 7, 2010
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Exposure apparatus adjusting method, exposure apparatus, and device...
Publication number
20090279059
Publication date
Nov 12, 2009
Nikon Corporation
Yosuke Shirata
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
NMR Probe
Publication number
20090261829
Publication date
Oct 22, 2009
JEOL Ltd.
Hiroshi Ikeda
G01 - MEASURING TESTING
Information
Patent Application
Exposure method, exposure apparatus, and method for producing device
Publication number
20090135382
Publication date
May 28, 2009
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
NMR Probe
Publication number
20080297156
Publication date
Dec 4, 2008
JEOL Ltd.
Hiroto Suematsu
G01 - MEASURING TESTING
Information
Patent Application
Exposure Apparatus, Exposure Method, and Device Producing Method
Publication number
20070252960
Publication date
Nov 1, 2007
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Exposure apparatus, surface position adjustment unit, mask, and dev...
Publication number
20040036849
Publication date
Feb 26, 2004
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Local signal-supplying device for NMR spectrometer
Publication number
20020109502
Publication date
Aug 15, 2002
JEOL Ltd.
Yoshiki Kida
G01 - MEASURING TESTING
Information
Patent Application
Substrate transport apparatus and method
Publication number
20020089655
Publication date
Jul 11, 2002
Nikon Corporation
Yoshiki Kida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Exposure apparatus, surface position adjustment unit, mask, and dev...
Publication number
20020003216
Publication date
Jan 10, 2002
Nikon Corporation
Yoshiki Kida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method for positioning substrate
Publication number
20010016293
Publication date
Aug 23, 2001
Nikon Corporation
Kenji Nishi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY