Yoshimasa Ito

Person

Kobe, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Attachment apparatus, test head, and electronic device test system
- Patent number 7,746,060
- Issue date Jun 29, 2010
- Advantest Corporation
- Atsuyuki Doi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a device with a high frequency signal
- Patent number 7,627,445
- Issue date Dec 1, 2009
- Advantest Corporation
- Yoshimasa Ito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system
- Patent number 7,135,853
- Issue date Nov 14, 2006
- Avantest Corporation
- Yoshimasa Ito
- G01 - MEASURING TESTING
Information Patent Grant
Modular connector assembly
- Patent number 6,709,296
- Issue date Mar 23, 2004
- Advantest Corporation
- Kouichi Shiroyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal material having photocatalytic activity and method of manufac...
- Patent number 6,106,955
- Issue date Aug 22, 2000
- Takenaka Corporation
- Takatoshi Ogawa
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Photosensitive material for electrophotography comprising organic p...
- Patent number 5,304,444
- Issue date Apr 19, 1994
- Matsushita Electric Industrial Co., Ltd.
- Sohji Tsuchiya
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Electrophotographic element with blocked isocyanate binder
- Patent number 5,204,203
- Issue date Apr 20, 1993
- Matsushita Electric Industrial Co., Ltd.
- Yoshimasa Ito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrochromic display having a dielectric layer
- Patent number 4,855,727
- Issue date Aug 8, 1989
- Matsushita Electric Industrial Company, Ltd.
- Soji Tsuchiya
- G02 - OPTICS
Information Patent Grant
Heat treatment of titanium alloys
- Patent number 4,167,427
- Issue date Sep 11, 1979
- Mitsubishi Jukogyo Kabushiki Kaisha
- Shoji Ueda
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

Patents Applicationslast 30 patents

Information Patent Application
ATTACHMENT APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM
- Publication number 20090184720
- Publication date Jul 23, 2009
- Advantest Corporation
- Atsuyuki Doi
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, PERFORMANCE BOARD AND INTERFACE PLATE
- Publication number 20080100330
- Publication date May 1, 2008
- Advantest Corporation
- Yoshimasa Ito
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing a device with a high frequency signal
- Publication number 20050171718
- Publication date Aug 4, 2005
- ADVANTEST CORPORTION
- Yoshimasa Ito
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system
- Publication number 20050077892
- Publication date Apr 14, 2005
- Advantest Corporation
- Yoshimasa Ito
- G01 - MEASURING TESTING
Information Patent Application
Connector
- Publication number 20020142662
- Publication date Oct 3, 2002
- Kouichi Shiroyama
- H01 - BASIC ELECTRIC ELEMENTS

Yoshimasa Ito

Person

Patents Grantslast 30 patents

Attachment apparatus, test head, and electronic device test system

Apparatus for testing a device with a high frequency signal

Semiconductor test system

Modular connector assembly

Metal material having photocatalytic activity and method of manufac...

Photosensitive material for electrophotography comprising organic p...

Electrophotographic element with blocked isocyanate binder

Electrochromic display having a dielectric layer

Heat treatment of titanium alloys

Patents Applicationslast 30 patents

ATTACHMENT APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM

TEST APPARATUS, PERFORMANCE BOARD AND INTERFACE PLATE

Apparatus for testing a device with a high frequency signal

Semiconductor test system

Connector