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Yoshimasa Kawase
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Manufacturing system for semiconductor device capable of controllin...
Patent number
8,735,181
Issue date
May 27, 2014
Kabushiki Kaisha Toshiba
Osamu Fujii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacture of semiconductor device
Patent number
7,557,040
Issue date
Jul 7, 2009
Kabushiki Kaisha Toshiba
Hiroshi Itokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for manufacturing a semiconductor device
Patent number
7,402,444
Issue date
Jul 22, 2008
Kabushiki Kaisha Toshiba
Yoshimasa Kawase
G01 - MEASURING TESTING
Information
Patent Grant
Ion implanter and method of manufacturing semiconductor device
Patent number
7,247,867
Issue date
Jul 24, 2007
Kabushiki Kaisha Toshiba
Hiroshi Itokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for evaluating semiconductor material
Patent number
7,145,658
Issue date
Dec 5, 2006
Kabushiki Kaisha Toshiba
Haruko Akutsu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MANUFACTURING SYSTEM FOR SEMICONDUCTOR DEVICE CAPABLE OF CONTROLLIN...
Publication number
20090114853
Publication date
May 7, 2009
Kabushiki Kaisha Toshiba
Osamu FUJII
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacture of semiconductor device
Publication number
20070166977
Publication date
Jul 19, 2007
Hiroshi Itokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for manufacturing a semiconductor device
Publication number
20070075272
Publication date
Apr 5, 2007
Yoshimasa Kawase
G01 - MEASURING TESTING
Information
Patent Application
Ion implanter and method of manufacturing semiconductor device
Publication number
20060017017
Publication date
Jan 26, 2006
Hiroshi Itokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for evaluating semiconductor material
Publication number
20040196464
Publication date
Oct 7, 2004
Haruko Akutsu
G01 - MEASURING TESTING