Yoshimasa Ogawa

Follow

Person

Himeji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Microchip testing device
- Patent number 7,808,620
- Issue date Oct 5, 2010
- Ushiodenki Kabushiki Kaisha
- Yoshimasa Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Microchip testing device
- Patent number 7,688,449
- Issue date Mar 30, 2010
- Ushiodenki Kabushiki Kaisha
- Yoshimasa Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Microchip testing device
- Patent number 7,636,162
- Issue date Dec 22, 2009
- Ushiodenki Kabushiki Kaisha
- Yoshimasa Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring the reflection factor
- Patent number 7,382,462
- Issue date Jun 3, 2008
- Ushiodenki Kabushiki Kaisha
- Shigeki Matsumoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CLEANING PROCESSING DEVICE FOR BIOLOGICAL IMPLANT
- Publication number 20130167873
- Publication date Jul 4, 2013
- Yoshimasa Ogawa
- B08 - CLEANING
Information Patent Application
MICROCHIP TESTING DEVICE
- Publication number 20090244539
- Publication date Oct 1, 2009
- Ushiodenki Kabushiki Kaisha
- Yoshimasa Ogawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MICROCHIP TESTING DEVICE
- Publication number 20080062423
- Publication date Mar 13, 2008
- Ushiodenki Kabushiki Kaisha
- Yoshimasa OGAWA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MICROCHIP TESTING DEVICE
- Publication number 20080002178
- Publication date Jan 3, 2008
- Ushiodenki Kabushiki Kaisha
- Yoshimasa OGAWA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Device for measuring the reflection factor
- Publication number 20060186407
- Publication date Aug 24, 2006
- Ushiodenki Kabushiki Kaisha
- Shigeki Matsumoto
- G01 - MEASURING TESTING