Yoshimasa Ogino

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Frequency characteristics measuring device
- Patent number 8,446,144
- Issue date May 21, 2013
- Advantest Corporation
- Shinji Kuniie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FREQUENCY CHARACTERISTICS MEASURING DEVICE
- Publication number 20100259245
- Publication date Oct 14, 2010
- ADVANTEST CORPORATION
- Shinji Kunie
- G01 - MEASURING TESTING