Yoshimasa Ono

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Processing apparatus, processing method, and computer readable medium
- Patent number 12,217,482
- Issue date Feb 4, 2025
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device, display method, and non-transitory computer-readabl...
- Patent number 12,175,593
- Issue date Dec 24, 2024
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface abnormality detection device and system
- Patent number 12,154,258
- Issue date Nov 26, 2024
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Abnormal part display apparatus, abnormal part display system, abno...
- Patent number 11,869,179
- Issue date Jan 9, 2024
- NEC Corporation
- Shigeo Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing apparatus, fingerprint image extraction processing appar...
- Patent number 11,417,144
- Issue date Aug 16, 2022
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING APPARATUS, SYSTEM, BIOMETRIC AUTHENTICATION SYSTEM, PROC...
- Publication number 20250054208
- Publication date Feb 13, 2025
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING APPARATUS, SYSTEM, BIOMETRIC AUTHENTICATION SYSTEM, PROC...
- Publication number 20250045985
- Publication date Feb 6, 2025
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABNORMALITY DETECTION APPARATUS, CONTROL METHOD, AND COMPUTER-READA...
- Publication number 20240255628
- Publication date Aug 1, 2024
- NEC Corporation
- Yoshimasa ONO
- G01 - MEASURING TESTING
Information Patent Application
IMAGING CONDITION DETERMINATION METHOD, IMAGING CONDITION DETERMINA...
- Publication number 20240249433
- Publication date Jul 25, 2024
- NEC Corporation
- Jiro ABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT CONDITION OPTIMIZATION SYSTEM, THREEDIMENSIONAL DATA ME...
- Publication number 20240249486
- Publication date Jul 25, 2024
- NEC Corporation
- Akira Tsuji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING DEVICE, ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECT...
- Publication number 20240054626
- Publication date Feb 15, 2024
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION DEVICE, DETERMINATION METHOD, AND NON-TRANSITORY COMPUTER...
- Publication number 20230375709
- Publication date Nov 23, 2023
- NEC Corporation
- Akira TSUJI
- G01 - MEASURING TESTING
Information Patent Application
MONITORING SYSTEM, METHOD, AND NON-TRANSITORY COMPUTER-READABLE MED...
- Publication number 20230333250
- Publication date Oct 19, 2023
- NEC Corporation
- Yoshimasa ONO
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING APPARATUS, DATA PROCESSING SYSTEM, AND DATA PROCESS...
- Publication number 20230080973
- Publication date Mar 16, 2023
- NEC Corporation
- Jiro Abe
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE, DISPLAY METHOD, AND NON-TRANSITORY COMPUTER-READABL...
- Publication number 20230080011
- Publication date Mar 16, 2023
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT APPARATUS, INFORMATION PROCESSING APPARATUS, DATA SPECI...
- Publication number 20230036969
- Publication date Feb 2, 2023
- NEC Corporation
- Jiro ABE
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING DEVICE, PROCESSING METHOD, AND COMPUTERREADABLE MEDIUM
- Publication number 20220343629
- Publication date Oct 27, 2022
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING APPARATUS, PROCESSING METHOD, AND COMPUTER READABLE MEDIUM
- Publication number 20220343628
- Publication date Oct 27, 2022
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE ANOMALY DETECTING DEVICE, SYSTEM, METHOD, AND NON-TRANSITOR...
- Publication number 20220276181
- Publication date Sep 1, 2022
- NEC Corporation
- Yoshimasa ONO
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, SYSTEM, BIOMETRIC AUTHENTICATION SYSTEM, PROC...
- Publication number 20220277498
- Publication date Sep 1, 2022
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE ABNORMALITY DETECTION DEVICE AND SYSTEM
- Publication number 20220170739
- Publication date Jun 2, 2022
- NEC Corporation
- Yoshimasa ONO
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ABNORMALITY DETECTION DEVICE AND SYSTEM
- Publication number 20220156914
- Publication date May 19, 2022
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING APPARATUS, FINGERPRINT IMAGE EXTRACTION PROCESSING APPAR...
- Publication number 20220139105
- Publication date May 5, 2022
- NEC Corporation
- Yoshimasa ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING DEVICE, SYSTEM, METHOD, AND NON-TRANSITORY COMPUTER READ...
- Publication number 20210341581
- Publication date Nov 4, 2021
- NEC Corporation
- Yoshimasa ONO
- G01 - MEASURING TESTING
Information Patent Application
ABNORMAL PART DISPLAY APPARATUS, ABNORMAL PART DISPLAY SYSTEM, ABNO...
- Publication number 20210287356
- Publication date Sep 16, 2021
- NEC Corporation
- Shigeo Suzuki
- G06 - COMPUTING CALCULATING COUNTING

Yoshimasa Ono

Person

Patents Grantslast 30 patents

Processing apparatus, processing method, and computer readable medium

Display device, display method, and non-transitory computer-readabl...

Surface abnormality detection device and system

Abnormal part display apparatus, abnormal part display system, abno...

Processing apparatus, fingerprint image extraction processing appar...

Patents Applicationslast 30 patents

PROCESSING APPARATUS, SYSTEM, BIOMETRIC AUTHENTICATION SYSTEM, PROC...

PROCESSING APPARATUS, SYSTEM, BIOMETRIC AUTHENTICATION SYSTEM, PROC...

ABNORMALITY DETECTION APPARATUS, CONTROL METHOD, AND COMPUTER-READA...

IMAGING CONDITION DETERMINATION METHOD, IMAGING CONDITION DETERMINA...

MEASUREMENT CONDITION OPTIMIZATION SYSTEM, THREEDIMENSIONAL DATA ME...

PROCESSING DEVICE, ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECT...

DETECTION DEVICE, DETERMINATION METHOD, AND NON-TRANSITORY COMPUTER...

MONITORING SYSTEM, METHOD, AND NON-TRANSITORY COMPUTER-READABLE MED...

DATA PROCESSING APPARATUS, DATA PROCESSING SYSTEM, AND DATA PROCESS...

DISPLAY DEVICE, DISPLAY METHOD, AND NON-TRANSITORY COMPUTER-READABL...

MEASUREMENT APPARATUS, INFORMATION PROCESSING APPARATUS, DATA SPECI...

PROCESSING DEVICE, PROCESSING METHOD, AND COMPUTERREADABLE MEDIUM

PROCESSING APPARATUS, PROCESSING METHOD, AND COMPUTER READABLE MEDIUM

SURFACE ANOMALY DETECTING DEVICE, SYSTEM, METHOD, AND NON-TRANSITOR...

PROCESSING APPARATUS, SYSTEM, BIOMETRIC AUTHENTICATION SYSTEM, PROC...

SURFACE ABNORMALITY DETECTION DEVICE AND SYSTEM

SURFACE ABNORMALITY DETECTION DEVICE AND SYSTEM

PROCESSING APPARATUS, FINGERPRINT IMAGE EXTRACTION PROCESSING APPAR...

PROCESSING DEVICE, SYSTEM, METHOD, AND NON-TRANSITORY COMPUTER READ...

ABNORMAL PART DISPLAY APPARATUS, ABNORMAL PART DISPLAY SYSTEM, ABNO...