Yoshimasa Ooshima

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and its apparatus for inspecting particles or defects of a s...
- Patent number 8,072,597
- Issue date Dec 6, 2011
- Hitachi, Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,511,806
- Issue date Mar 31, 2009
- Hitachi High-Tech Electronics Engineering Co., Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,315,366
- Issue date Jan 1, 2008
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting particles or defects of a s...
- Patent number 7,256,412
- Issue date Aug 14, 2007
- Hitachi, Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting electronic circuit pattern
- Patent number 7,231,079
- Issue date Jun 12, 2007
- Hitachi, Ltd.
- Hirohito Okuda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,187,438
- Issue date Mar 6, 2007
- Hitachi, Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting particles or defects of a s...
- Patent number 7,115,892
- Issue date Oct 3, 2006
- Hitachi, Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting particles or defects of a s...
- Patent number 6,998,630
- Issue date Feb 14, 2006
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting particles or defects of a s...
- Patent number 6,797,975
- Issue date Sep 28, 2004
- Hitachi, Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Its Apparatus for Inspecting Particles or Defects of a S...
- Publication number 20120062890
- Publication date Mar 15, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Method and Its Apparatus for Inspecting Particles or Defects of a S...
- Publication number 20080246964
- Publication date Oct 9, 2008
- Hitachi, Ltd
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECTS
- Publication number 20080117415
- Publication date May 22, 2008
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting particles or defects of a semic...
- Publication number 20070257214
- Publication date Nov 8, 2007
- Hitachi, Ltd
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting defects
- Publication number 20070153264
- Publication date Jul 5, 2007
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and its apparatus for inspecting particles or defects of a s...
- Publication number 20070001132
- Publication date Jan 4, 2007
- Hitachi, Ltd
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Method and its apparatus for inspecting particles or defects of a s...
- Publication number 20060091332
- Publication date May 4, 2006
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Method and its apparatus for inspecting particles or defects of a s...
- Publication number 20050024633
- Publication date Feb 3, 2005
- Hitachi, Ltd
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
.Apparatus and method for inspecting defects
- Publication number 20020122174
- Publication date Sep 5, 2002
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and system for inspecting electronic circuit pattern
- Publication number 20020113234
- Publication date Aug 22, 2002
- Hirohito Okuda
- G01 - MEASURING TESTING
Information Patent Application
Method and its apparatus for inspecting particles or defects of a s...
- Publication number 20020047097
- Publication date Apr 25, 2002
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING

Yoshimasa Ooshima

Person

Patents Grantslast 30 patents

Method and its apparatus for inspecting particles or defects of a s...

Apparatus and method for inspecting defects

Apparatus and method for inspecting defects

Method and its apparatus for inspecting particles or defects of a s...

Method and system for inspecting electronic circuit pattern

Apparatus and method for inspecting defects

Method and its apparatus for inspecting particles or defects of a s...

Method and its apparatus for inspecting particles or defects of a s...

Method and its apparatus for inspecting particles or defects of a s...

Patents Applicationslast 30 patents

Method and Its Apparatus for Inspecting Particles or Defects of a S...

Method and Its Apparatus for Inspecting Particles or Defects of a S...

APPARATUS AND METHOD FOR INSPECTING DEFECTS

Method and apparatus for inspecting particles or defects of a semic...

Apparatus and method for inspecting defects

Method and its apparatus for inspecting particles or defects of a s...

Method and its apparatus for inspecting particles or defects of a s...

Method and its apparatus for inspecting particles or defects of a s...

.Apparatus and method for inspecting defects

Method and system for inspecting electronic circuit pattern

Method and its apparatus for inspecting particles or defects of a s...