Yoshimasa OSHIMA

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus
- Patent number 9,506,872
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,934,092
- Issue date Jan 13, 2015
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,705,026
- Issue date Apr 22, 2014
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and inspecting apparatus for substrate surface
- Patent number 8,654,350
- Issue date Feb 18, 2014
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method
- Patent number 8,482,727
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 8,477,302
- Issue date Jul 2, 2013
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,400,629
- Issue date Mar 19, 2013
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting defects
- Patent number 8,314,929
- Issue date Nov 20, 2012
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and inspecting apparatus for substrate surface
- Patent number 8,310,665
- Issue date Nov 13, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,264,679
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 8,218,138
- Issue date Jul 10, 2012
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and inspecting apparatus for substrate surface
- Patent number 8,144,337
- Issue date Mar 27, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,120,766
- Issue date Feb 21, 2012
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 8,115,915
- Issue date Feb 14, 2012
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,035,808
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,973,920
- Issue date Jul 5, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defect on a surface of a specimen
- Patent number 7,970,199
- Issue date Jun 28, 2011
- Hitachi High-Technologies Corporation
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting defects
- Patent number 7,965,386
- Issue date Jun 21, 2011
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method
- Patent number 7,916,288
- Issue date Mar 29, 2011
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting defects
- Patent number 7,869,024
- Issue date Jan 11, 2011
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,768,635
- Issue date Aug 3, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting device for sample surface and defect detection me...
- Patent number 7,719,673
- Issue date May 18, 2010
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 7,710,557
- Issue date May 4, 2010
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method
- Patent number 7,675,613
- Issue date Mar 9, 2010
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,333,192
- Issue date Feb 19, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting foreign matter and device for realizing same
- Patent number 5,046,847
- Issue date Sep 10, 1991
- Hitachi Ltd.
- Toshihiko Nakata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic contaminants detection apparatus
- Patent number 4,614,427
- Issue date Sep 30, 1986
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern detection system
- Patent number 4,508,453
- Issue date Apr 2, 1985
- Hitachi, Ltd.
- Yasuhiko Hara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for inspecting specimen surface
- Patent number 4,423,331
- Issue date Dec 27, 1983
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for projection type mask alignment
- Patent number 4,362,389
- Issue date Dec 7, 1982
- Hitachi, Ltd.
- Mituyoshi Koizumi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS
- Publication number 20140192353
- Publication date Jul 10, 2014
- Hitachi High-Technologies Corporation
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20140176943
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20130208271
- Publication date Aug 15, 2013
- Hitachi High-Technologies Corporation
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
Inspecting Method and Inspecting Apparatus For Substrate Surface
- Publication number 20130107247
- Publication date May 2, 2013
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus
- Publication number 20120320373
- Publication date Dec 20, 2012
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Application
Inspecting Method and Inspecting Apparatus for Substrate Surface
- Publication number 20120162665
- Publication date Jun 28, 2012
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus
- Publication number 20120140211
- Publication date Jun 7, 2012
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method
- Publication number 20120133926
- Publication date May 31, 2012
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20120008138
- Publication date Jan 12, 2012
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Inspecting Defects
- Publication number 20110255074
- Publication date Oct 20, 2011
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
Method And Its Apparatus For Inspecting Defects
- Publication number 20110211191
- Publication date Sep 1, 2011
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method
- Publication number 20110128534
- Publication date Jun 2, 2011
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
Method and Its Apparatus For Inspecting Defects
- Publication number 20110080578
- Publication date Apr 7, 2011
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECTS
- Publication number 20110063603
- Publication date Mar 17, 2011
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECTS
- Publication number 20100265496
- Publication date Oct 21, 2010
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20100265494
- Publication date Oct 21, 2010
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Tool For Sample Surface And Defect Detection Meth...
- Publication number 20100225904
- Publication date Sep 9, 2010
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method
- Publication number 20100149528
- Publication date Jun 17, 2010
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus
- Publication number 20100060895
- Publication date Mar 11, 2010
- Hitachi High-Technologies Corporation
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
Inspecting Method and Inspecting Apparatus for Substrate Surface
- Publication number 20090290168
- Publication date Nov 26, 2009
- Akira HAMAMATSU
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20090279081
- Publication date Nov 12, 2009
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
Method and Its Apparatus for Inspecting Defects
- Publication number 20090257058
- Publication date Oct 15, 2009
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method
- Publication number 20090195775
- Publication date Aug 6, 2009
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Inspecting Defects
- Publication number 20090122303
- Publication date May 14, 2009
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20080304055
- Publication date Dec 11, 2008
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION TOOL FOR SAMPLE SURFACE AND DEFECT DETECTION METH...
- Publication number 20080151235
- Publication date Jun 26, 2008
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Inspecting Defects
- Publication number 20080144024
- Publication date Jun 19, 2008
- Hitachi High-Technologies Corporation 24-14
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECT ON A SURFACE OF A SPECIMEN
- Publication number 20070285670
- Publication date Dec 13, 2007
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting defects
- Publication number 20070177136
- Publication date Aug 2, 2007
- Hiroyuki Nakano
- G01 - MEASURING TESTING

Yoshimasa OSHIMA

Person

Patents Grantslast 30 patents

Inspection apparatus

Surface defect inspection method and apparatus

Inspection apparatus

Inspecting method and inspecting apparatus for substrate surface

Defect inspection method

Defect inspection apparatus

Surface defect inspection method and apparatus

Method and its apparatus for inspecting defects

Inspecting method and inspecting apparatus for substrate surface

Inspection apparatus

Apparatus and method for inspecting defects

Inspecting method and inspecting apparatus for substrate surface

Inspection apparatus

Defect inspection method and apparatus

Surface defect inspection method and apparatus

Apparatus and method for inspecting defects

Method and apparatus for detecting defect on a surface of a specimen

Method and its apparatus for inspecting defects

Defect inspection method

Method and its apparatus for inspecting defects

Apparatus and method for inspecting defects

Defect inspecting device for sample surface and defect detection me...

Surface defect inspection method and apparatus

Defect inspection method

Apparatus and method for inspecting defects

Method for detecting foreign matter and device for realizing same

Automatic contaminants detection apparatus

Pattern detection system

Method and apparatus for inspecting specimen surface

Method and apparatus for projection type mask alignment

Patents Applicationslast 30 patents

INSPECTION APPARATUS

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

Inspecting Method and Inspecting Apparatus For Substrate Surface

Inspection Apparatus

Inspecting Method and Inspecting Apparatus for Substrate Surface

Inspection Apparatus

Defect Inspection Method

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

Apparatus and Method for Inspecting Defects

Method And Its Apparatus For Inspecting Defects

Defect Inspection Method

Method and Its Apparatus For Inspecting Defects

APPARATUS AND METHOD FOR INSPECTING DEFECTS

APPARATUS AND METHOD FOR INSPECTING DEFECTS

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

Defect Inspection Tool For Sample Surface And Defect Detection Meth...

Defect Inspection Method

Inspection Apparatus

Inspecting Method and Inspecting Apparatus for Substrate Surface

DEFECT INSPECTION APPARATUS

Method and Its Apparatus for Inspecting Defects

Defect Inspection Method

Apparatus And Method For Inspecting Defects

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

DEFECT INSPECTION TOOL FOR SAMPLE SURFACE AND DEFECT DETECTION METH...

Apparatus And Method For Inspecting Defects

METHOD AND APPARATUS FOR DETECTING DEFECT ON A SURFACE OF A SPECIMEN

Apparatus and method for inspecting defects