Yoshimasa Suzuki

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Data acquisition apparatus
- Patent number 11,965,830
- Issue date Apr 23, 2024
- EVIDENT CORPORATION
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
System for reconstructing and outputting a structure of an estimati...
- Patent number 11,867,624
- Issue date Jan 9, 2024
- EVIDENT CORPORATION
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Data acquisition apparatus
- Patent number 11,269,191
- Issue date Mar 8, 2022
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Sample shape measuring method and sample shape measuring apparatus
- Patent number 11,175,129
- Issue date Nov 16, 2021
- Olympus Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation apparatus
- Patent number 10,983,055
- Issue date Apr 20, 2021
- Olympus Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Focusing method, measuring method, principal point detecting method...
- Patent number 10,705,325
- Issue date Jul 7, 2020
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Sample shape measuring apparatus for calculating a shape of a sampl...
- Patent number 10,697,764
- Issue date Jun 30, 2020
- Olympus Corporation
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Specimen observation apparatus and specimen observation method
- Patent number 10,649,191
- Issue date May 12, 2020
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Sample shape measuring apparatus
- Patent number 10,539,411
- Issue date Jan 21, 2020
- Olympus Corporation
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Sample shape measuring method and sample shape measuring apparatus
- Patent number 10,458,781
- Issue date Oct 29, 2019
- Olympus Corporation
- Mayumi Odaira
- G02 - OPTICS
Information Patent Grant
Sample shape measuring method and sample shape measuring apparatus
- Patent number 10,458,785
- Issue date Oct 29, 2019
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Sample observation device and sample observation method
- Patent number 10,310,247
- Issue date Jun 4, 2019
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Sample observation device
- Patent number 10,302,928
- Issue date May 28, 2019
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Sample observation method and sample observation device
- Patent number 10,241,316
- Issue date Mar 26, 2019
- Olympus Corporation
- Yoshimasa Suzuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sample observation device and sample observation method
- Patent number 10,133,050
- Issue date Nov 20, 2018
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Observation unit and microscope system equipped with observation unit
- Patent number 9,671,604
- Issue date Jun 6, 2017
- Olympus Corporation
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Grant
Microscope objective lens
- Patent number 9,170,413
- Issue date Oct 27, 2015
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Microscope objective lens
- Patent number 8,928,987
- Issue date Jan 6, 2015
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Measuring instrument and measuring method
- Patent number 8,198,592
- Issue date Jun 12, 2012
- Olympus Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and measuring method
- Patent number 7,820,984
- Issue date Oct 26, 2010
- Olympus Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus utilizing total reflection
- Patent number 7,570,362
- Issue date Aug 4, 2009
- Olympus Corporation
- Shinichi Dosaka
- G01 - MEASURING TESTING
Information Patent Grant
Microscope imaging apparatus and biological-specimen examination sy...
- Patent number 7,271,952
- Issue date Sep 18, 2007
- Olympus Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Imaging optical system and optical apparatus using the same
- Patent number 6,822,806
- Issue date Nov 23, 2004
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Image forming optical system and optical device using the same
- Patent number 6,775,071
- Issue date Aug 10, 2004
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Collimating lens
- Patent number 6,744,563
- Issue date Jun 1, 2004
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
REFRACTIVE INDEX DISTRIBUTION GENERATION DEVICE, REFRACTIVE INDEX D...
- Publication number 20250003879
- Publication date Jan 2, 2025
- Evident Corporation
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE IMAGE GENERATION DEVICE, SAMPLE IMAGE GENERATION METHOD, SAM...
- Publication number 20240428554
- Publication date Dec 26, 2024
- Evident Corporation
- Yoshimasa SUZUKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE OBSERVATION APPARATUS
- Publication number 20240118529
- Publication date Apr 11, 2024
- Evident Corporation
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
MICROSCOPE SYSTEM
- Publication number 20230418038
- Publication date Dec 28, 2023
- Evident Corporation
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
REFRACTIVE INDEX DISTRIBUTION ESTIMATING SYSTEM
- Publication number 20220074854
- Publication date Mar 10, 2022
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
DATA ACQUISITION APPARATUS
- Publication number 20210247619
- Publication date Aug 12, 2021
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION APPARATUS
- Publication number 20210199944
- Publication date Jul 1, 2021
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
DATA ACQUISITION APPARATUS
- Publication number 20210048387
- Publication date Feb 18, 2021
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION APPARATUS
- Publication number 20190271644
- Publication date Sep 5, 2019
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20190265022
- Publication date Aug 29, 2019
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G02 - OPTICS
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20190265024
- Publication date Aug 29, 2019
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20190041198
- Publication date Feb 7, 2019
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20180313643
- Publication date Nov 1, 2018
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20180073865
- Publication date Mar 15, 2018
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
SPECIMEN OBSERVATION APPARATUS AND SPECIMEN OBSERVATION METHOD
- Publication number 20180045944
- Publication date Feb 15, 2018
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20170184832
- Publication date Jun 29, 2017
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
FOCUSING METHOD, MEASURING METHOD, PRINCIPAL POINT DETECTING METHOD...
- Publication number 20160357002
- Publication date Dec 8, 2016
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION DEVICE
- Publication number 20160306155
- Publication date Oct 20, 2016
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20160048011
- Publication date Feb 18, 2016
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION METHOD AND SAMPLE OBSERVATION DEVICE
- Publication number 20160025959
- Publication date Jan 28, 2016
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
Observation Unit and Microscope System Equipped with Observation Unit
- Publication number 20150070484
- Publication date Mar 12, 2015
- OLYMPUS CORPORATION
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Application
Microscope Objective Lens
- Publication number 20130194660
- Publication date Aug 1, 2013
- OLYMPUS CORPORATION
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Application
Microscope Objective Lens
- Publication number 20130194678
- Publication date Aug 1, 2013
- OLYMPUS CORPORATION
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20090189087
- Publication date Jul 30, 2009
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING INSTRUMENT AND MEASURING METHOD
- Publication number 20090189080
- Publication date Jul 30, 2009
- OLYMPUS CORPORATION
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement apparatus
- Publication number 20090086211
- Publication date Apr 2, 2009
- Shinichi Dosaka
- G01 - MEASURING TESTING
Information Patent Application
Microscope imaging apparatus and biological-specimen examination sy...
- Publication number 20070121198
- Publication date May 31, 2007
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Application
Microscope imaging apparatus and biological-specimen examination sy...
- Publication number 20070121199
- Publication date May 31, 2007
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Application
Microscope imaging apparatus and biological-specimen examination sy...
- Publication number 20070121200
- Publication date May 31, 2007
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Application
Microscope imaging apparatus and biological-specimen examination sy...
- Publication number 20060018013
- Publication date Jan 26, 2006
- Yoshimasa Suzuki
- G02 - OPTICS

Yoshimasa Suzuki

Person

Patents Grantslast 30 patents

Data acquisition apparatus

System for reconstructing and outputting a structure of an estimati...

Data acquisition apparatus

Sample shape measuring method and sample shape measuring apparatus

Sample observation apparatus

Focusing method, measuring method, principal point detecting method...

Sample shape measuring apparatus for calculating a shape of a sampl...

Specimen observation apparatus and specimen observation method

Sample shape measuring apparatus

Sample shape measuring method and sample shape measuring apparatus

Sample shape measuring method and sample shape measuring apparatus

Sample observation device and sample observation method

Sample observation device

Sample observation method and sample observation device

Sample observation device and sample observation method

Observation unit and microscope system equipped with observation unit

Microscope objective lens

Microscope objective lens

Measuring instrument and measuring method

Measuring device and measuring method

Optical measurement apparatus utilizing total reflection

Microscope imaging apparatus and biological-specimen examination sy...

Imaging optical system and optical apparatus using the same

Image forming optical system and optical device using the same

Collimating lens

Patents Applicationslast 30 patents

REFRACTIVE INDEX DISTRIBUTION GENERATION DEVICE, REFRACTIVE INDEX D...

SAMPLE IMAGE GENERATION DEVICE, SAMPLE IMAGE GENERATION METHOD, SAM...

SAMPLE OBSERVATION APPARATUS

MICROSCOPE SYSTEM

REFRACTIVE INDEX DISTRIBUTION ESTIMATING SYSTEM

DATA ACQUISITION APPARATUS

SAMPLE OBSERVATION APPARATUS

DATA ACQUISITION APPARATUS

SAMPLE OBSERVATION APPARATUS

SAMPLE SHAPE MEASURING APPARATUS

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

SPECIMEN OBSERVATION APPARATUS AND SPECIMEN OBSERVATION METHOD

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

FOCUSING METHOD, MEASURING METHOD, PRINCIPAL POINT DETECTING METHOD...

SAMPLE OBSERVATION DEVICE

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

SAMPLE OBSERVATION METHOD AND SAMPLE OBSERVATION DEVICE

Observation Unit and Microscope System Equipped with Observation Unit

Microscope Objective Lens

Microscope Objective Lens

MEASURING DEVICE AND MEASURING METHOD

MEASURING INSTRUMENT AND MEASURING METHOD

Optical measurement apparatus

Microscope imaging apparatus and biological-specimen examination sy...

Microscope imaging apparatus and biological-specimen examination sy...

Microscope imaging apparatus and biological-specimen examination sy...

Microscope imaging apparatus and biological-specimen examination sy...