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Yoshimasa SUZUKI

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  • Ibaraki, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    MEASUREMENT APPARATUS AND MEASUREMENT METHOD
    • Publication number 20220057512
    • Publication date Feb 24, 2022
    • Mitutoyo Corporation
    • Shinji KOMATSUZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT APPARATUS AND MEASUREMENT METHOD
    • Publication number 20210063573
    • Publication date Mar 4, 2021
    • MITUTOYO CORPORATION
    • Yoshimasa SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT APPARATUS AND MEASUREMENT METHOD
    • Publication number 20210011155
    • Publication date Jan 14, 2021
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT APPARATUS AND MEASUREMENT METHOD
    • Publication number 20200379112
    • Publication date Dec 3, 2020
    • MITUTOYO CORPORATION
    • Hiroki UJIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    GRAZING INCIDENCE INTERFEROMETER
    • Publication number 20150241201
    • Publication date Aug 27, 2015
    • MITUTOYO CORPORATION
    • Yoshimasa SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROFILE MEASURING INSTRUMENT
    • Publication number 20130321821
    • Publication date Dec 5, 2013
    • Yoshimasa SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MICROSCOPE
    • Publication number 20110007324
    • Publication date Jan 13, 2011
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MICROSCOPE
    • Publication number 20100199393
    • Publication date Aug 5, 2010
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Oblique incidence interferometer
    • Publication number 20100014098
    • Publication date Jan 21, 2010
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Shape measuring apparatus
    • Publication number 20090021747
    • Publication date Jan 22, 2009
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measuring apparatus
    • Publication number 20080047335
    • Publication date Feb 28, 2008
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Oblique incidence interferometer
    • Publication number 20080002212
    • Publication date Jan 3, 2008
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Interferometer and shape measuring method
    • Publication number 20060262320
    • Publication date Nov 23, 2006
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Interferometer and method of calibrating the interferometer
    • Publication number 20060250618
    • Publication date Nov 9, 2006
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING