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Yoshimi Horigome
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Tokyo, JP
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last 30 patents
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Patent Grant
Fabrication method of semiconductor integrated circuit device and p...
Patent number
7,688,086
Issue date
Mar 30, 2010
Renesas Technology Corp.
Yasuhiro Motoyama
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND P...
Publication number
20070108997
Publication date
May 17, 2007
RENESAS TECHNOLOGY CORP.
Yasuhiro Motoyama
G01 - MEASURING TESTING