Yoshimi Kawanami

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing emitter, emitter, and focused ion beam appa...
- Patent number 11,081,312
- Issue date Aug 3, 2021
- Hitachi High-Tech Science Corporation
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field ionization source, ion beam apparatus, and beam irradiation m...
- Patent number 10,971,329
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and cleaning method for gas field ion source
- Patent number 10,840,070
- Issue date Nov 17, 2020
- HITACHI HIGH-TECH CORPORATION
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 10,790,112
- Issue date Sep 29, 2020
- Hitachi High-Tech Science Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing emitter
- Patent number 10,658,143
- Issue date May 19, 2020
- Hitachi High-Tech Science Corporation
- Yoko Nakajima
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Ion beam apparatus
- Patent number 10,651,006
- Issue date May 12, 2020
- Hitachi High-Tech Science Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 10,636,623
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 10,366,858
- Issue date Jul 30, 2019
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 10,304,656
- Issue date May 28, 2019
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam apparatus and ion beam irradiation method
- Patent number 10,211,022
- Issue date Feb 19, 2019
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam system
- Patent number 10,163,602
- Issue date Dec 25, 2018
- Hitachi High-Tech Science Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and emitter tip adjustment method
- Patent number 9,761,407
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source and ion beam device using same
- Patent number 9,640,360
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ionization ion source and ion beam device
- Patent number 9,196,453
- Issue date Nov 24, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope
- Patent number 9,111,716
- Issue date Aug 18, 2015
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emitter, gas field ion source, and ion beam device
- Patent number 9,087,675
- Issue date Jul 21, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning ion microscope and secondary particle control method
- Patent number 9,058,959
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ionization ion source and ion beam apparatus
- Patent number 9,018,597
- Issue date Apr 28, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device having gas introduction port disposed on structure...
- Patent number 8,981,315
- Issue date Mar 17, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source and method for using same, ion beam device, an...
- Patent number 8,847,173
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gas field ionization ion source and ion beam device
- Patent number 8,809,801
- Issue date Aug 19, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,569,719
- Issue date Oct 29, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming partitions of plasma display panel by using sand...
- Patent number RE44445
- Issue date Aug 20, 2013
- Hitachi Consumer Electronics Co., Ltd.
- Akihiro Fujinaga
- 313 - Electric lamp and discharge devices
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,405,053
- Issue date Mar 26, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,999,240
- Issue date Aug 16, 2011
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming partitions of plasma display panel by using sand...
- Patent number RE42405
- Issue date May 31, 2011
- Fujitsu Hitachi Plasma Display Limited
- Akihiro Fujinaga
- 313 - Electric lamp and discharge devices
Information Patent Grant
Plasma display panel driving method and plasma display apparatus
- Patent number 7,911,419
- Issue date Mar 22, 2011
- Fujitsu Hitachi Plasma Display Limited
- Yasunobu Hashimoto
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Display device and display panel device
- Patent number 7,898,510
- Issue date Mar 1, 2011
- Fujitsu Hitachi Plasma Display Limited
- Nobuyuki Hori
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,791,050
- Issue date Sep 7, 2010
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Display panel device with a light-permeable front sheet
- Patent number 7,755,287
- Issue date Jul 13, 2010
- Fujitsu Hitachi Plasma Display Limited
- Nobuyuki Hori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING EMITTER, EMITTER, AND FOCUSED ION BEAM APPA...
- Publication number 20200312603
- Publication date Oct 1, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tomokazu KOZAKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE AND CLEANING METHOD FOR GAS FIELD ION SOURCE
- Publication number 20200294776
- Publication date Sep 17, 2020
- Hitachi High-Technologies Corporation
- Yoshimi KAWANAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device
- Publication number 20190295802
- Publication date Sep 26, 2019
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING EMITTER
- Publication number 20190267208
- Publication date Aug 29, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoko NAKAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD IONIZATION SOURCE, ION BEAM APPARATUS, AND BEAM IRRADIATION M...
- Publication number 20190051491
- Publication date Feb 14, 2019
- Hitachi High-Technologies Corporation
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Apparatus
- Publication number 20180308658
- Publication date Oct 25, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS
- Publication number 20180233319
- Publication date Aug 16, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshimi KAWANAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM SYSTEM
- Publication number 20180012726
- Publication date Jan 11, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device
- Publication number 20170352517
- Publication date Dec 7, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20170323764
- Publication date Nov 9, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki MUTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM APPARATUS AND ION BEAM IRRADIATION METHOD
- Publication number 20170229277
- Publication date Aug 10, 2017
- Hitachi High-Technologies Corporation
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device and Emitter Tip Adjustment Method
- Publication number 20160225575
- Publication date Aug 4, 2016
- Hiroyuki MUTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE
- Publication number 20150083930
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD
- Publication number 20150048247
- Publication date Feb 19, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas Field Ionization Ion Source and Ion Beam Apparatus
- Publication number 20150041650
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE
- Publication number 20140326897
- Publication date Nov 6, 2014
- Yoshimi KAWANAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE AND ION BEAM DEVICE USING SAME
- Publication number 20140299768
- Publication date Oct 9, 2014
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20140197329
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMITTER, GAS FIELD ION SOURCE, AND ION BEAM DEVICE
- Publication number 20140191128
- Publication date Jul 10, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Microscope and Ion Microscope
- Publication number 20130126731
- Publication date May 23, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...
- Publication number 20130119252
- Publication date May 16, 2013
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CHARGED PARTICLE MICROSCOPE
- Publication number 20120217391
- Publication date Aug 30, 2012
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE
- Publication number 20120199758
- Publication date Aug 9, 2012
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20120085924
- Publication date Apr 12, 2012
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20110140006
- Publication date Jun 16, 2011
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY PANEL DEVICE WITH A LIGHT-PERMEABLE FRONT SHEET
- Publication number 20100219750
- Publication date Sep 2, 2010
- FUJITSU HITACHI PLASMA DISPLAY LIMITED
- Nobuyuki Hori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA DISPLAY PANEL
- Publication number 20090140951
- Publication date Jun 4, 2009
- Hitachi, Ltd.
- Noriaki SETOGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20090008578
- Publication date Jan 8, 2009
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
PLASMA DISPLAY PANEL
- Publication number 20080315767
- Publication date Dec 25, 2008
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND DISPLAY PANEL DEVICE
- Publication number 20080309237
- Publication date Dec 18, 2008
- FUJITSU HITACHI PLASMA DISPLAY LIMITED
- Nobuyuki Hori
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Yoshimi Kawanami

Person

Patents Grantslast 30 patents

Method of manufacturing emitter, emitter, and focused ion beam appa...

Field ionization source, ion beam apparatus, and beam irradiation m...

Ion beam device and cleaning method for gas field ion source

Focused ion beam apparatus

Method of manufacturing emitter

Ion beam apparatus

Ion beam device

Ion beam device

Ion beam device

Ion beam apparatus and ion beam irradiation method

Ion beam system

Ion beam device and emitter tip adjustment method

Ion source and ion beam device using same

Gas field ionization ion source and ion beam device

Charged particle microscope

Emitter, gas field ion source, and ion beam device

Scanning ion microscope and secondary particle control method

Gas field ionization ion source and ion beam apparatus

Ion beam device having gas introduction port disposed on structure...

Gas field ion source and method for using same, ion beam device, an...

Gas field ionization ion source and ion beam device

Method and apparatus for specimen fabrication

Method for forming partitions of plasma display panel by using sand...

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method for forming partitions of plasma display panel by using sand...

Plasma display panel driving method and plasma display apparatus

Display device and display panel device

Method and apparatus for specimen fabrication

Display panel device with a light-permeable front sheet

Patents Applicationslast 30 patents

METHOD OF MANUFACTURING EMITTER, EMITTER, AND FOCUSED ION BEAM APPA...

ION BEAM DEVICE AND CLEANING METHOD FOR GAS FIELD ION SOURCE

Ion Beam Device

METHOD OF MANUFACTURING EMITTER

FIELD IONIZATION SOURCE, ION BEAM APPARATUS, AND BEAM IRRADIATION M...

Ion Beam Apparatus

FOCUSED ION BEAM APPARATUS

ION BEAM SYSTEM

Ion Beam Device

ION BEAM DEVICE

ION BEAM APPARATUS AND ION BEAM IRRADIATION METHOD

Ion Beam Device and Emitter Tip Adjustment Method

CHARGED PARTICLE MICROSCOPE

SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD

Gas Field Ionization Ion Source and Ion Beam Apparatus

GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE

ION SOURCE AND ION BEAM DEVICE USING SAME

ION BEAM DEVICE

EMITTER, GAS FIELD ION SOURCE, AND ION BEAM DEVICE

Charged Particle Microscope and Ion Microscope

GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...

CHARGED PARTICLE MICROSCOPE

GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

DISPLAY PANEL DEVICE WITH A LIGHT-PERMEABLE FRONT SHEET

PLASMA DISPLAY PANEL

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

PLASMA DISPLAY PANEL

DISPLAY DEVICE AND DISPLAY PANEL DEVICE