Yoshimi Sudo

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Hachioji, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for X-ray analyses
- Patent number 5,877,498
- Issue date Mar 2, 1999
- Hitachi, Ltd.
- Aritoshi Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for x-ray analyses
- Patent number 5,594,246
- Issue date Jan 14, 1997
- Hitachi, Ltd.
- Yoshimi Sudo
- G01 - MEASURING TESTING