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Yoshimi Yamamoto
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Ibaraki-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Process state detector, semiconductor sensor and display device for...
Patent number
6,016,706
Issue date
Jan 25, 2000
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Composite condition detection apparatus for detecting static pressu...
Patent number
5,677,493
Issue date
Oct 14, 1997
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure sensor
Patent number
5,672,826
Issue date
Sep 30, 1997
Hitachi, Ltd.
Hideo Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Multi-function differential pressure sensor with thin supporting base
Patent number
5,635,649
Issue date
Jun 3, 1997
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure transmitter having symmetrical construction
Patent number
5,621,175
Issue date
Apr 15, 1997
Hitachi, Ltd.
Akira Nagasu
G01 - MEASURING TESTING
Information
Patent Grant
Process detection apparatus
Patent number
5,554,809
Issue date
Sep 10, 1996
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor sensor for detecting physical amount without thermal...
Patent number
5,537,882
Issue date
Jul 23, 1996
Seiichi Ugai
G01 - MEASURING TESTING
Information
Patent Grant
Compact differential pressure transmitter having first and second d...
Patent number
5,531,120
Issue date
Jul 2, 1996
Hitachi, Ltd.
Akira Nagasu
G01 - MEASURING TESTING
Information
Patent Grant
Process condition detecting apparatus and semiconductor sensor cond...
Patent number
5,528,940
Issue date
Jun 25, 1996
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Multi-function differential pressure sensor with thin stationary base
Patent number
5,477,738
Issue date
Dec 26, 1995
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-function fluid measuring and transmitting apparatus
Patent number
5,469,749
Issue date
Nov 28, 1995
Hitachi, Ltd.
Satoshi Shimada
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure sensor capable of removing influence of stati...
Patent number
5,412,992
Issue date
May 9, 1995
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure transmitter
Patent number
4,995,266
Issue date
Feb 26, 1991
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure converting device
Patent number
4,972,716
Issue date
Nov 27, 1990
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor differential pressure transducer
Patent number
4,546,653
Issue date
Oct 15, 1985
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure transmitter
Patent number
4,342,231
Issue date
Aug 3, 1982
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Pressure sensitive apparatus
Patent number
4,303,903
Issue date
Dec 1, 1981
Hitachi, Ltd.
Yoshitaka Matsuoka
G01 - MEASURING TESTING
Information
Patent Grant
Pressure transducer
Patent number
4,264,889
Issue date
Apr 28, 1981
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING