Yoshimitsu Morita

Follow

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analytical tool
- Patent number 7,955,554
- Issue date Jun 7, 2011
- ARKRAY, Inc.
- Yasuhide Kusaka
- G01 - MEASURING TESTING
Information Patent Grant
Analytical tool
- Patent number 7,771,575
- Issue date Aug 10, 2010
- ARKRAY, Inc.
- Yasuhide Kusaka
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing tool with knob part
- Patent number 7,651,595
- Issue date Jan 26, 2010
- ARKRAY, Inc.
- Shigeru Doi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring specific component
- Patent number 7,347,926
- Issue date Mar 25, 2008
- ARKRAY, Inc.
- Yoshimitsu Morita
- G01 - MEASURING TESTING
Information Patent Grant
Fail judging method for analysis and analyzer
- Patent number 7,083,712
- Issue date Aug 1, 2006
- ARKRAY, Inc.
- Yoshimitsu Morita
- G01 - MEASURING TESTING
Information Patent Grant
Fail judging method and analyzer
- Patent number 7,008,525
- Issue date Mar 7, 2006
- ARKRAY, Inc.
- Yoshimitsu Morita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYTICAL TOOL
- Publication number 20090304550
- Publication date Dec 10, 2009
- ARKRAY, INC.
- Yasuhide KUSAKA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Analyzing tool with knob part
- Publication number 20060243589
- Publication date Nov 2, 2006
- Shigeru Doi
- G01 - MEASURING TESTING
Information Patent Application
Analytical tool
- Publication number 20060042941
- Publication date Mar 2, 2006
- ARKRAY, INC.
- Yasuhide Kusaka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Fail judging method and analyzer
- Publication number 20050067301
- Publication date Mar 31, 2005
- Yoshimitsu Morita
- G01 - MEASURING TESTING
Information Patent Application
Fail judging method for analysis and analyzer
- Publication number 20050000829
- Publication date Jan 6, 2005
- Yoshimitsu Morita
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus FOr Measuring Specific Component
- Publication number 20040259264
- Publication date Dec 23, 2004
- Yoshimitsu Morita
- G01 - MEASURING TESTING