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Yoshimitsu Takagi
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer and sample-processing system
Patent number
10,094,846
Issue date
Oct 9, 2018
Hitachi High-Technologies Corporation
Hitoshi Tokieda
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,297,820
Issue date
Mar 29, 2016
Hitachi High-Technologies Corporation
Noriko Iizumi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and sample-processing system
Patent number
9,229,019
Issue date
Jan 5, 2016
Hitach High-Technologies Corporation
Hitoshi Tokieda
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,063,104
Issue date
Jun 23, 2015
Hitachi High-Technologies Corporation
Masashi Akutsu
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and method for using the same
Patent number
9,063,106
Issue date
Jun 23, 2015
Hitachi High-Technologies, Corporation
Kenichi Yagi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and sample-processing system
Patent number
8,701,504
Issue date
Apr 22, 2014
Hitachi High-Technologies Corporation
Hitoshi Tokieda
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
8,600,689
Issue date
Dec 3, 2013
Hitachi High-Technologies Corporation
Toshihide Orihashi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
8,580,196
Issue date
Nov 12, 2013
Hitachi High-Technologies Corporation
Yasunao Awata
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer with the function of rendering reagent informati...
Patent number
8,544,723
Issue date
Oct 1, 2013
Hitachi High-Technologies Corporation
Teruhiro Yamano
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and sample-processing system
Patent number
8,252,233
Issue date
Aug 28, 2012
Hitachi High-Technologies Corporation
Hitoshi Tokieda
G01 - MEASURING TESTING
Information
Patent Grant
Specimen rack and specimen carrier system
Patent number
8,216,511
Issue date
Jul 10, 2012
Hitachi High-Technologies Corporation
Kiyoteru Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device
Patent number
8,151,190
Issue date
Apr 3, 2012
Hitachi High-Technologies Corporation
Miki Taki
G01 - MEASURING TESTING
Information
Patent Grant
ISE analytical unit for clinical analyzer
Patent number
D637730
Issue date
May 10, 2011
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Reagent cassette and automatic analyzer using the same
Patent number
7,887,751
Issue date
Feb 15, 2011
Hitachi High-Technologies Corporation
Tomonori Mimura
G01 - MEASURING TESTING
Information
Patent Grant
Sample buffer unit for clinical analyzer
Patent number
D631975
Issue date
Feb 1, 2011
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Sampler unit for clinical analyzer
Patent number
D631976
Issue date
Feb 1, 2011
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Graphical user interface for a computer display
Patent number
D614191
Issue date
Apr 20, 2010
Hitachi High-Technologies Corporation
Masaki Takano
D14 - Recording, communication, or information retrieval equipment
Information
Patent Grant
Graphical user interface for a computer display
Patent number
D614192
Issue date
Apr 20, 2010
Hitachi High-Technologies Corporation
Masaki Takano
D14 - Recording, communication, or information retrieval equipment
Information
Patent Grant
Graphical user interface for a computer display
Patent number
D602496
Issue date
Oct 20, 2009
Hitachi High-Technologies Corporation
Masaki Takano
D14 - Recording, communication, or information retrieval equipment
Information
Patent Grant
Operation guidance method of clinical system
Patent number
6,868,308
Issue date
Mar 15, 2005
Hitachi, Ltd.
Eitaro Ito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
Publication number
20180313862
Publication date
Nov 1, 2018
Hitachi High-Technologies Corporation
Hitoshi TOKIEDA
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Application
AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
Publication number
20160084864
Publication date
Mar 24, 2016
Hitachi High-Technologies Corporation
Hitoshi TOKIEDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
Publication number
20120294764
Publication date
Nov 22, 2012
Hitachi High-Technologies Corporation
Hitoshi TOKIEDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER WITH THE FUNCTION OF RENDERING REAGENT INFORMATI...
Publication number
20120080516
Publication date
Apr 5, 2012
Hitachi High-Technologies Corporation
Teruhiro Yamano
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20110256022
Publication date
Oct 20, 2011
Masashi Akutsu
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
Publication number
20110162438
Publication date
Jul 7, 2011
Hitachi High-Technologies Corporation
Hitoshi Tokieda
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20090202390
Publication date
Aug 13, 2009
Noriko IIZUMI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
Publication number
20090162247
Publication date
Jun 25, 2009
Hitoshi TOKIEDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND METHOD FOR USING THE SAME
Publication number
20090035867
Publication date
Feb 5, 2009
Kenichi Yagi
G01 - MEASURING TESTING
Information
Patent Application
Specimen Rack and Specimen Carrier System
Publication number
20080299007
Publication date
Dec 4, 2008
Kiyoteru Noguchi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20080056939
Publication date
Mar 6, 2008
Yasunao AWATA
G01 - MEASURING TESTING
Information
Patent Application
Automatc analyzer
Publication number
20070072299
Publication date
Mar 29, 2007
Toshihide Orihashi
G01 - MEASURING TESTING
Information
Patent Application
Analysis device
Publication number
20070038411
Publication date
Feb 15, 2007
Miki Taki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Reagent cassette and automatic analyzer using the same
Publication number
20050084426
Publication date
Apr 21, 2005
Tomonori Mimura
G01 - MEASURING TESTING
Information
Patent Application
Operation guidance method of clinical system
Publication number
20020031444
Publication date
Mar 14, 2002
Eitaro Ito
G01 - MEASURING TESTING