Yoshinao HIRABAYASHI

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Matsumoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mapping-projection-type electron beam apparatus for inspecting samp...
- Patent number 8,124,933
- Issue date Feb 28, 2012
- Ebara Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Mapping-projection-type electron beam apparatus for inspecting samp...
- Patent number 7,592,586
- Issue date Sep 22, 2009
- Ebara Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAPPING-PROJECTION-TYPE ELECTRON BEAM APPARATUS FOR INSPECTING SAMP...
- Publication number 20100019149
- Publication date Jan 28, 2010
- EBARA CORPORATION
- Kenji WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Mapping-projection-type electron beam apparatus for inspecting samp...
- Publication number 20060237646
- Publication date Oct 26, 2006
- Kenji Watanabe
- G01 - MEASURING TESTING