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YOSHINAO TATEI

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  • CHIYODA-KU, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Position detector and linear transport apparatus
    • Patent number 12,203,778
    • Issue date Jan 21, 2025
    • Mitsubishi Electric Corporation
    • Yoshinao Tatei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic linear position detector
    • Patent number 11,933,640
    • Issue date Mar 19, 2024
    • Mitsubishi Electric Corporation
    • Takeshi Musha
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Connector and electronic device system
    • Patent number 11,239,578
    • Issue date Feb 1, 2022
    • Mitsubishi Electric Corporation
    • Keisuke Tada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Manufacturing method of semiconductor package
    • Patent number 9,953,844
    • Issue date Apr 24, 2018
    • Mitsubishi Electric Corporation
    • Masanori Nimura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Rotation detection device and method of manufacturing rotation dete...
    • Patent number 9,869,565
    • Issue date Jan 16, 2018
    • Mitsubishi Electric Corporation
    • Takeshi Musha
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Position detection device
    • Patent number 9,792,688
    • Issue date Oct 17, 2017
    • Mitsubishi Electric Corporation
    • Osamu Nasu
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Rotation number detector
    • Patent number 9,664,535
    • Issue date May 30, 2017
    • Mitsubishi Electric Corporation
    • Yoshinao Tatei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotation number detector
    • Patent number 9,631,953
    • Issue date Apr 25, 2017
    • Mitsubishi Electric Corporation
    • Yoshinao Tatei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Absolute encoder
    • Patent number 9,605,981
    • Issue date Mar 28, 2017
    • Mitsubishi Electric Corporation
    • Takuya Noguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical encoder
    • Patent number 8,829,421
    • Issue date Sep 9, 2014
    • Mitsubishi Electric Corporation
    • Takuya Noguchi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents