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Yoshinobu Asokawa
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Nara, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for generating projecting pattern
Patent number
8,103,089
Issue date
Jan 24, 2012
OMRON Corporation
Masaki Suwa
G01 - MEASURING TESTING
Information
Patent Grant
Image processing apparatus, image processing method, image processi...
Patent number
8,019,120
Issue date
Sep 13, 2011
Omron Corporation
Yoshiro Murata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for generating projecting pattern
Patent number
7,940,981
Issue date
May 10, 2011
Omron Corporation
Masaki Suwa
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional shape measuring apparatus, program, computer-read...
Patent number
7,684,052
Issue date
Mar 23, 2010
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern light irradiation device, three dimensional shape measuring...
Patent number
7,388,679
Issue date
Jun 17, 2008
Omron Corporation
Masanao Yoshino
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring the number of pass persons and a management sy...
Patent number
5,926,518
Issue date
Jul 20, 1999
Omron Corporation
Yoshinobu Asokawa
G07 - CHECKING-DEVICES
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING PROJECTING PATTERN
Publication number
20110096982
Publication date
Apr 28, 2011
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTING DEVICE, DETECTING METHOD, AND PROGRAM
Publication number
20090018711
Publication date
Jan 15, 2009
OMRON CORPORATION
Tadakazu Ueda
G08 - SIGNALLING
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, IMAGE PROCESSI...
Publication number
20070253596
Publication date
Nov 1, 2007
OMRON CORPORATION
Yoshiro Murata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Three-dimensional shape measuring apparatus, program, computer-read...
Publication number
20070090189
Publication date
Apr 26, 2007
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Pattern light irradiation device, three-dimensional shape measuring...
Publication number
20070064245
Publication date
Mar 22, 2007
Omron Corporation
Masanao Yoshino
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for generating projecting pattern
Publication number
20070009150
Publication date
Jan 11, 2007
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING