Yoshinobu Hoshino

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle microscope device and method for adjusting field-o...
- Patent number 12,170,183
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment system and seal for positional alignment
- Patent number 11,538,657
- Issue date Dec 27, 2022
- HITACHI HIGH-TECH CORPORATION
- Yaku Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope device and wide-field image generation...
- Patent number 11,508,047
- Issue date Nov 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging device
- Patent number 11,385,193
- Issue date Jul 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device
- Patent number 11,239,050
- Issue date Feb 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Miku Maehara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,763,078
- Issue date Sep 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus, observation method using charged p...
- Patent number 10,763,074
- Issue date Sep 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,522,325
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus, observation method using charged p...
- Patent number 10,453,650
- Issue date Oct 22, 2019
- Hitachi High-Technologies Corporation
- Hiroyuki Chiba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample holder
- Patent number 10,431,417
- Issue date Oct 1, 2019
- Hitachi High-Technologies Corporation
- Akira Ikeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,099,283
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,947,520
- Issue date Feb 3, 2015
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for correcting detected sig...
- Patent number 8,848,049
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Masato Kamio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning electron microscope and three-dimensional shape measuring...
- Patent number 7,705,304
- Issue date Apr 27, 2010
- Hitachi High-Technologies Corporation
- Shigeru Kawamata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OBSERVATION SYSTEM AND ARTIFACT CORRECTION METHOD FOR SAME
- Publication number 20240412333
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Mitsutoshi KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE MICROSCOPE DEVICE AND METHOD FOR ADJUSTING FIELD-O...
- Publication number 20220351935
- Publication date Nov 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Alignment System and Seal for Positional Alignment
- Publication number 20210407761
- Publication date Dec 30, 2021
- Hitachi High-Tech Corporation
- Yaku MAEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging Device
- Publication number 20210247335
- Publication date Aug 12, 2021
- Hitachi High-Tech Corporation
- Hiroyuki CHIBA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Imaging Device
- Publication number 20210193432
- Publication date Jun 24, 2021
- Hitachi High-Tech Corporation
- Miku MAEHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE DEVICE AND WIDE-FIELD IMAGE GENERATION...
- Publication number 20200265568
- Publication date Aug 20, 2020
- Hitachi High-Technologies Corporation
- Mitsutoshi KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20200066484
- Publication date Feb 27, 2020
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...
- Publication number 20200013583
- Publication date Jan 9, 2020
- Hitachi High-Technologies Corporation
- Hiroyuki CHIBA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Holder
- Publication number 20190122853
- Publication date Apr 25, 2019
- Akira IKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...
- Publication number 20180323035
- Publication date Nov 8, 2018
- Hitachi High-Technologies Corporation
- Hiroyuki CHIBA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20180301316
- Publication date Oct 18, 2018
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIG...
- Publication number 20130278745
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Masato Kamio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20120307038
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20120019648
- Publication date Jan 26, 2012
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and Three-Dimensional Shape Measuring...
- Publication number 20080283747
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Shigeru Kawamata
- H01 - BASIC ELECTRIC ELEMENTS

Yoshinobu Hoshino

Person

Patents Grantslast 30 patents

Charged particle microscope device and method for adjusting field-o...

Alignment system and seal for positional alignment

Charged particle microscope device and wide-field image generation...

Imaging device

Imaging device

Charged particle beam device and image processing method in charged...

Charged particle beam apparatus, observation method using charged p...

Charged particle beam device and image processing method in charged...

Charged particle beam apparatus, observation method using charged p...

Charged particle beam device and sample holder

Charged particle beam apparatus

Electron microscope

Charged particle beam device and method for correcting detected sig...

Scanning electron microscope and three-dimensional shape measuring...

Patents Applicationslast 30 patents

OBSERVATION SYSTEM AND ARTIFACT CORRECTION METHOD FOR SAME

CHARGED PARTICLE MICROSCOPE DEVICE AND METHOD FOR ADJUSTING FIELD-O...

Alignment System and Seal for Positional Alignment

Imaging Device

Imaging Device

CHARGED PARTICLE MICROSCOPE DEVICE AND WIDE-FIELD IMAGE GENERATION...

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...

Charged Particle Beam Device and Sample Holder

CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIG...

CHARGED PARTICLE BEAM APPARATUS

ELECTRON MICROSCOPE

Scanning Electron Microscope and Three-Dimensional Shape Measuring...