Yoshinobu Kimura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Power conversion device, motor control system, and diagnosis method...
- Patent number 11,152,887
- Issue date Oct 19, 2021
- Hitachi, Ltd.
- Yoshinobu Kimura
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Diagnosis system for power conversion device, diagnosis method for...
- Patent number 11,016,138
- Issue date May 25, 2021
- Hitachi, Ltd.
- Yoshinobu Kimura
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Scanning electron microscope and sample observation method
- Patent number 10,840,060
- Issue date Nov 17, 2020
- HITACHI HIGH-TECH CORPORATION
- Zhaohui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power converter and diagnostic system thereof
- Patent number 10,451,687
- Issue date Oct 22, 2019
- Hitachi, Ltd.
- Kazuki Tani
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle bean device and information-processing device
- Patent number 10,453,648
- Issue date Oct 22, 2019
- Hitachi High-Technologies Corporation
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam measurement...
- Patent number 10,121,634
- Issue date Nov 6, 2018
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and sample observation method
- Patent number 9,991,092
- Issue date Jun 5, 2018
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection device including a counter electrode with...
- Patent number 9,846,133
- Issue date Dec 19, 2017
- Hitachi, Ltd.
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and inspection method using the same
- Patent number 9,659,744
- Issue date May 23, 2017
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection method, semiconductor inspection device an...
- Patent number 9,508,611
- Issue date Nov 29, 2016
- Hitachi, Ltd.
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic microscope, setting method of observation condition of e...
- Patent number 9,236,220
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation specimen for use in electron microscopy, electron micro...
- Patent number 9,202,668
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and image capturing method using electron beam
- Patent number 8,907,279
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- G01 - MEASURING TESTING
Information Patent Grant
Crystallization method, crystallization apparatus, processed substr...
- Patent number 8,114,217
- Issue date Feb 14, 2012
- Sharp Kabushiki Kaisha
- Masayuki Jyumonji
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 8,034,696
- Issue date Oct 11, 2011
- Renesas Electronics Corporation
- Ryuta Tsuchiya
- C30 - CRYSTAL GROWTH
Information Patent Grant
Semiconductor device and manufacturing method of the same
- Patent number 7,944,024
- Issue date May 17, 2011
- Renesas Electronics Corporation
- Masao Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method of the same
- Patent number 7,868,425
- Issue date Jan 11, 2011
- Renesas Electronics Corporation
- Masao Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film semiconductor device, polycrystalline semiconductor thin...
- Patent number 7,859,016
- Issue date Dec 28, 2010
- Hitachi, Ltd.
- Mutsuko Hatano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Non-volatile memory device and method of manufacturing the same
- Patent number 7,838,379
- Issue date Nov 23, 2010
- Hitachi, Ltd.
- Masaharu Kinoshita
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including a P-type field-effect transistor
- Patent number 7,812,398
- Issue date Oct 12, 2010
- Hitachi, Ltd.
- Shinichi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystallization apparatus, optical member for use in crystallizatio...
- Patent number 7,692,864
- Issue date Apr 6, 2010
- Advanced LCD Technologies Development Center Co., Ltd.
- Yukio Taniguchi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Thin film transistor, circuit apparatus and liquid crystal display
- Patent number 7,608,891
- Issue date Oct 27, 2009
- Kabushiki Kaisha Ekisho Sentan Gijutsu Kaihatsu Center
- Masato Hiramatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystallization apparatus and crystallization method
- Patent number 7,572,335
- Issue date Aug 11, 2009
- Advanced LCD Technologies Development Center Co., Ltd.
- Yukio Taniguchi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Thin film semiconductor device, polycrystalline semiconductor thin...
- Patent number 7,556,993
- Issue date Jul 7, 2009
- Hitachi, Ltd.
- Mutsuko Hatano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Crystallization apparatus, optical member for use in crystallizatio...
- Patent number 7,537,660
- Issue date May 26, 2009
- Advanced LCD Technologies Development Center Co., Ltd.
- Yukio Taniguchi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor device and manufacturing method of the same
- Patent number 7,531,853
- Issue date May 12, 2009
- Hitachi, Ltd.
- Shinichi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin-film semiconductor substrate, method of manufacturing thin-fil...
- Patent number 7,518,252
- Issue date Apr 14, 2009
- Advanced LCD Technologies Development Center Co., Ltd.
- Masato Hiramatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystallization apparatus, crystallization method, and phase shifter
- Patent number 7,505,204
- Issue date Mar 17, 2009
- Advanced LCD Technologies Development Center Co., Ltd.
- Yukio Taniguchi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Oxygen concentrating apparatus
- Patent number 7,491,264
- Issue date Feb 17, 2009
- Teijin Pharma Limited
- Shinichi Tao
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Polysilicon semiconductor thin film substrate, method for producing...
- Patent number 7,491,972
- Issue date Feb 17, 2009
- Hitachi, Ltd.
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POWER CONVERSION DEVICE, MOTOR CONTROL SYSTEM, AND DIAGNOSIS METHOD...
- Publication number 20210021227
- Publication date Jan 21, 2021
- Hitachi, Ltd
- Yoshinobu KIMURA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
POWER CONVERTER AND DIAGNOSTIC SYSTEM THEREOF
- Publication number 20190310322
- Publication date Oct 10, 2019
- Hitachi, Ltd
- Kazuki TANI
- G01 - MEASURING TESTING
Information Patent Application
Diagnosis System for Power Conversion Device, Diagnosis Method for...
- Publication number 20190146026
- Publication date May 16, 2019
- Hitachi, Ltd
- Yoshinobu KIMURA
- B60 - VEHICLES IN GENERAL
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD
- Publication number 20180269032
- Publication date Sep 20, 2018
- Zhaohui CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Information-Processing Device
- Publication number 20170345614
- Publication date Nov 30, 2017
- Hitachi High-Technologies Corporation
- Yoshinobu KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Charged Particle Beam Measurement...
- Publication number 20160225583
- Publication date Aug 4, 2016
- Hitachi High-Technologies Corporation
- Natsuki TSUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION METHOD, SEMICONDUCTOR INSPECTION DEVICE AN...
- Publication number 20160190020
- Publication date Jun 30, 2016
- Hitachi, Ltd
- Yoshinobu KIMURA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND INSPECTION METHOD USING THE SAME
- Publication number 20160148781
- Publication date May 26, 2016
- Hitachi High-Technologies Corporation
- Natsuki TSUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE, AND INSPECTION METHOD USING CHARGE...
- Publication number 20150303030
- Publication date Oct 22, 2015
- Hitachi, Ltd
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC MICROSCOPE, SETTING METHOD OF OBSERVATION CONDITION OF E...
- Publication number 20150041644
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...
- Publication number 20140264018
- Publication date Sep 18, 2014
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE AND IMAGE CAPTURING METHOD USING ELECTRON BEAM
- Publication number 20140097342
- Publication date Apr 10, 2014
- Natsuki Tsuno
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD
- Publication number 20120153145
- Publication date Jun 21, 2012
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20110018032
- Publication date Jan 27, 2011
- Masao Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM SEMICONDUCTOR DEVICE, POLYCRYSTALLINE SEMICONDUCTOR THIN...
- Publication number 20090269892
- Publication date Oct 29, 2009
- Mutsuko Hatano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Semiconductor Device and Manufacturing Method of the Same
- Publication number 20090261412
- Publication date Oct 22, 2009
- SHINICHI SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-VOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20090189137
- Publication date Jul 30, 2009
- Hitachi, Ltd.
- Masaharu Kinoshita
- G11 - INFORMATION STORAGE
Information Patent Application
CRYSTALLIZATION APPARATUS, OPTICAL MEMBER FOR USE IN CRYSTALLIZATIO...
- Publication number 20090180190
- Publication date Jul 16, 2009
- Yukio Taniguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CRYSTALLIZATION APPARATUS, OPTICAL MEMBER FOR USE IN CRYSTALLIZATIO...
- Publication number 20090181483
- Publication date Jul 16, 2009
- Yukio Taniguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20090140233
- Publication date Jun 4, 2009
- Masaharu KINOSHITA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20090045470
- Publication date Feb 19, 2009
- Masao Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTALLIZATION METHOD, CRYSTALLIZATION APPARATUS, PROCESSED SUBSTR...
- Publication number 20080289573
- Publication date Nov 27, 2008
- Masayuki Jyumonji
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20080258218
- Publication date Oct 23, 2008
- RENESAS TECHNOLOGY CORP.
- Yusuke Morita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, AND PHASE SHIFTER
- Publication number 20080019002
- Publication date Jan 24, 2008
- Advanced LCD Technologies Dev. Ctr. Co., Ltd
- Yukio TANIGUCHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20070284582
- Publication date Dec 13, 2007
- SHINICHI SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20070266933
- Publication date Nov 22, 2007
- Ryuta Tsuchiya
- C30 - CRYSTAL GROWTH
Information Patent Application
Oxygen concentrating apparatus
- Publication number 20070163441
- Publication date Jul 19, 2007
- Teijin Pharma Limited
- Shinichi Tao
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Thin film semiconductor device, polycrystalline semiconductor thin...
- Publication number 20070105263
- Publication date May 10, 2007
- Mutsuko Hatano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR DEVICE, ANNEALING METHOD, ANNEALING APPARATUS AND DIS...
- Publication number 20070096103
- Publication date May 3, 2007
- Advanced LCD Technologies Dev. Ctr. Co., Ltd
- Masayuki Jyumonji
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
THIN FILM TRANSISTOR, CIRCUIT APPARATUS AND LIQUID CRYSTAL DISPLAY
- Publication number 20070023759
- Publication date Feb 1, 2007
- Masato Hiramatsu
- H01 - BASIC ELECTRIC ELEMENTS

Yoshinobu Kimura

Person

Patents Grantslast 30 patents

Power conversion device, motor control system, and diagnosis method...

Diagnosis system for power conversion device, diagnosis method for...

Scanning electron microscope and sample observation method

Power converter and diagnostic system thereof

Charged particle bean device and information-processing device

Charged particle beam device and charged particle beam measurement...

Scanning electron microscope and sample observation method

Semiconductor inspection device including a counter electrode with...

Charged particle beam apparatus and inspection method using the same

Semiconductor inspection method, semiconductor inspection device an...

Electronic microscope, setting method of observation condition of e...

Observation specimen for use in electron microscopy, electron micro...

Electron microscope and image capturing method using electron beam

Crystallization method, crystallization apparatus, processed substr...

Manufacturing method of semiconductor device

Semiconductor device and manufacturing method of the same

Semiconductor device and manufacturing method of the same

Thin film semiconductor device, polycrystalline semiconductor thin...

Non-volatile memory device and method of manufacturing the same

Semiconductor device including a P-type field-effect transistor

Crystallization apparatus, optical member for use in crystallizatio...

Thin film transistor, circuit apparatus and liquid crystal display

Crystallization apparatus and crystallization method

Thin film semiconductor device, polycrystalline semiconductor thin...

Crystallization apparatus, optical member for use in crystallizatio...

Semiconductor device and manufacturing method of the same

Thin-film semiconductor substrate, method of manufacturing thin-fil...

Crystallization apparatus, crystallization method, and phase shifter

Oxygen concentrating apparatus

Polysilicon semiconductor thin film substrate, method for producing...

Patents Applicationslast 30 patents

POWER CONVERSION DEVICE, MOTOR CONTROL SYSTEM, AND DIAGNOSIS METHOD...

POWER CONVERTER AND DIAGNOSTIC SYSTEM THEREOF

Diagnosis System for Power Conversion Device, Diagnosis Method for...

SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

Charged Particle Beam Device and Information-Processing Device

Charged Particle Beam Device and Charged Particle Beam Measurement...

SEMICONDUCTOR INSPECTION METHOD, SEMICONDUCTOR INSPECTION DEVICE AN...

CHARGED PARTICLE BEAM APPARATUS AND INSPECTION METHOD USING THE SAME

SEMICONDUCTOR INSPECTION DEVICE, AND INSPECTION METHOD USING CHARGE...

ELECTRONIC MICROSCOPE, SETTING METHOD OF OBSERVATION CONDITION OF E...

OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...

ELECTRON MICROSCOPE AND IMAGE CAPTURING METHOD USING ELECTRON BEAM

SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

THIN FILM SEMICONDUCTOR DEVICE, POLYCRYSTALLINE SEMICONDUCTOR THIN...

Semiconductor Device and Manufacturing Method of the Same

NON-VOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

CRYSTALLIZATION APPARATUS, OPTICAL MEMBER FOR USE IN CRYSTALLIZATIO...

CRYSTALLIZATION APPARATUS, OPTICAL MEMBER FOR USE IN CRYSTALLIZATIO...

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

CRYSTALLIZATION METHOD, CRYSTALLIZATION APPARATUS, PROCESSED SUBSTR...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, AND PHASE SHIFTER

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

Manufacturing method of semiconductor device

Oxygen concentrating apparatus

Thin film semiconductor device, polycrystalline semiconductor thin...

SEMICONDUCTOR DEVICE, ANNEALING METHOD, ANNEALING APPARATUS AND DIS...

THIN FILM TRANSISTOR, CIRCUIT APPARATUS AND LIQUID CRYSTAL DISPLAY