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Yoshinobu Sakakibara
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Radiation monitor and radiation measurement method
Patent number
11,536,858
Issue date
Dec 27, 2022
Hitachi, Ltd.
Takahiro Tadokoro
G01 - MEASURING TESTING
Information
Patent Grant
Radiation monitor and method of analyzing radiation monitor
Patent number
10,877,167
Issue date
Dec 29, 2020
Hitachi, Ltd.
Takahiro Tadokoro
G01 - MEASURING TESTING
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Patent Grant
Dosage rate measurement system and dosage rate measurement method
Patent number
9,274,233
Issue date
Mar 1, 2016
Hitachi, Ltd.
Katsunori Ueno
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RADIATION MONITOR AND RADIATION MEASUREMENT METHOD
Publication number
20200278458
Publication date
Sep 3, 2020
Hitachi, Ltd
Takahiro TADOKORO
G01 - MEASURING TESTING
Information
Patent Application
RADIATION MONITOR AND METHOD OF ANALYZING RADIATION MONITOR
Publication number
20190204457
Publication date
Jul 4, 2019
Hitachi, Ltd
Takahiro TADOKORO
G01 - MEASURING TESTING
Information
Patent Application
DOSAGE RATE MEASUREMENT SYSTEM AND DOSAGE RATE MEASUREMENT METHOD
Publication number
20150123002
Publication date
May 7, 2015
Hitachi, Ltd
Katsunori Ueno
G01 - MEASURING TESTING