Yoshinori FUJISAWA

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Fuchu City, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus
- Patent number 11,543,445
- Issue date Jan 3, 2023
- Tokyo Electron Limited
- Shigeru Kasai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE
- Publication number 20200386805
- Publication date Dec 10, 2020
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20140043051
- Publication date Feb 13, 2014
- TOKYO ELECTRON LIMITED
- Haruo IWATSU
- G01 - MEASURING TESTING