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Yoshinori Fujiwara
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatuses and methods for flexible fuse transmission
Patent number
10,056,154
Issue date
Aug 21, 2018
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses and methods for flexible fuse transmission
Patent number
9,934,869
Issue date
Apr 3, 2018
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses and methods for flexible fuse transmission
Patent number
9,824,770
Issue date
Nov 21, 2017
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses and methods for flexible fuse transmission
Patent number
9,666,307
Issue date
May 30, 2017
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses and methods for multi-memory array accesses
Patent number
9,293,191
Issue date
Mar 22, 2016
Micron Technology, Inc.
Yuan He
G11 - INFORMATION STORAGE
Information
Patent Grant
Methods for defect testing of externally accessible integrated circ...
Patent number
8,736,291
Issue date
May 27, 2014
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Redundant memory array for replacing memory sections of main memory
Patent number
8,582,377
Issue date
Nov 12, 2013
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
JTAG controlled self-repair after packaging
Patent number
8,230,274
Issue date
Jul 24, 2012
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Redundant memory array for replacing memory sections of main memory
Patent number
8,159,890
Issue date
Apr 17, 2012
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
JTAG controlled self-repair after packaging
Patent number
8,122,304
Issue date
Feb 21, 2012
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods for defect testing of externally accessible int...
Patent number
7,990,163
Issue date
Aug 2, 2011
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Colorimetric absorbance measurement apparatus
Patent number
7,910,061
Issue date
Mar 22, 2011
Furuno Electric Company, Limited
Yasuhiro Higuchi
G01 - MEASURING TESTING
Information
Patent Grant
Redundant memory array for replacing memory sections of main memory
Patent number
7,885,128
Issue date
Feb 8, 2011
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
JTAG controlled self-repair after packaging
Patent number
7,831,870
Issue date
Nov 9, 2010
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
JTAG controlled self-repair after packaging
Patent number
7,721,163
Issue date
May 18, 2010
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods for defect testing of externally accessible int...
Patent number
7,612,574
Issue date
Nov 3, 2009
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Selectable memory word line deactivation
Patent number
7,403,444
Issue date
Jul 22, 2008
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Selectable memory word line deactivation
Patent number
7,196,964
Issue date
Mar 27, 2007
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Devices for storing and accumulating defect information, semiconduc...
Patent number
7,000,156
Issue date
Feb 14, 2006
Mitsubishi Denki Kabushiki Kaisha
Yutaka Shimada
G11 - INFORMATION STORAGE
Information
Patent Grant
Workpiece stage of a resist curing device
Patent number
6,897,415
Issue date
May 24, 2005
Ushiodenki Kabushiki Kaisha
Yoshinori Fujiwara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with process monitor circuit and test method t...
Patent number
6,853,177
Issue date
Feb 8, 2005
Renesas Technology Corp.
Mari Shibayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor memory device having redundancy structure with defect...
Patent number
6,667,915
Issue date
Dec 23, 2003
Mitsubishi Denki Kabushiki Kaisha
Toshiaki Yonezu
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for making a blade for electrophotographic dev...
Patent number
5,776,395
Issue date
Jul 7, 1998
Bando Kagaku Kabushiki Kaisha
Yoshinori Fujiwara
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Gage for use in welding
Patent number
5,611,149
Issue date
Mar 18, 1997
Fuji Tool Co., Ltd.
Yoshinori Fujiwara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUSES AND METHODS FOR FLEXIBLE FUSE TRANSMISSION
Publication number
20180075920
Publication date
Mar 15, 2018
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUSES AND METHODS FOR MULTI-MEMORY ARRAY ACCESSES
Publication number
20160064065
Publication date
Mar 3, 2016
Micron Technology, Inc.
Yuan He
G11 - INFORMATION STORAGE
Information
Patent Application
REDUNDANT MEMORY ARRAY FOR REPLACING MEMORY SECTIONS OF MAIN MEMORY
Publication number
20130254513
Publication date
Sep 26, 2013
Micron Technology, Inc.
Yoshinori Fujiwara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REDUNDANT MEMORY ARRAY FOR REPLACING MEMORY SECTIONS OF MAIN MEMORY
Publication number
20120182817
Publication date
Jul 19, 2012
Micron Technology, Inc.
Yoshinori Fujiwara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
JTAG CONTROLLED SELF-REPAIR AFTER PACKAGING
Publication number
20120120749
Publication date
May 17, 2012
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
METHODS FOR DEFECT TESTING OF EXTERNALLY ACCESSIBLE INTEGRATED CIRC...
Publication number
20110273185
Publication date
Nov 10, 2011
Micron Technology, Inc.
Yoshinori Fujiwara
G01 - MEASURING TESTING
Information
Patent Application
REDUNDANT MEMORY ARRAY FOR REPLACING MEMORY SECTIONS OF MAIN MEMORY
Publication number
20110122715
Publication date
May 26, 2011
Yoshinori Fujiwara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
JTAG CONTROLLED SELF-REPAIR AFTER PACKAGING
Publication number
20110035635
Publication date
Feb 10, 2011
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
JTAG CONTROLLED SELF-REPAIR AFTER PACKAGING
Publication number
20100205489
Publication date
Aug 12, 2010
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
REDUNDANT MEMORY ARRAY FOR REPLACING MEMORY SECTIONS OF MAIN MEMORY
Publication number
20100097871
Publication date
Apr 22, 2010
Micron Technology, Inc.
Yoshinori Fujiwara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR DEFECT TESTING OF EXTERNALLY ACCESSIBLE INT...
Publication number
20100013510
Publication date
Jan 21, 2010
Micron Technology, Inc.
Yoshinori Fujiwara
G01 - MEASURING TESTING
Information
Patent Application
JTAG controlled self-repair after packaging
Publication number
20080263392
Publication date
Oct 23, 2008
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
SYSTEMS AND METHODS FOR DEFECT TESTING OF EXTERNALLY ACCESSIBLE INT...
Publication number
20080180116
Publication date
Jul 31, 2008
Micron Technology, Inc.
Yoshinori Fujiwara
G01 - MEASURING TESTING
Information
Patent Application
Selectable memory word line deactivation
Publication number
20070140038
Publication date
Jun 21, 2007
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
Selectable memory word line deactivation
Publication number
20050122826
Publication date
Jun 9, 2005
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
Devices for storing and accumulating defect information, semiconduc...
Publication number
20030221144
Publication date
Nov 27, 2003
Mitsubishi Denki Kabushiki Kaisha
Yutaka Shimada
G11 - INFORMATION STORAGE
Information
Patent Application
Apparatus of testing semiconductor
Publication number
20030210068
Publication date
Nov 13, 2003
Mitsubishi Denki Kabushiki Kaisha
Yoshinori Fujiwara
G01 - MEASURING TESTING
Information
Patent Application
Colorimetric absorbance measurement apparatus
Publication number
20030072680
Publication date
Apr 17, 2003
Yasuhiro Higuchi
G01 - MEASURING TESTING
Information
Patent Application
Test circuit for semiconductor memory and semiconductor memory device
Publication number
20030065996
Publication date
Apr 3, 2003
Mitsubishi Denki Kabushiki Kaisha
Yutaka Shimada
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor memory device having redundancy structure with defect...
Publication number
20030058716
Publication date
Mar 27, 2003
Mitsubishi Denki Kabushiki Kaisha
Toshiaki Yonezu
G11 - INFORMATION STORAGE
Information
Patent Application
Workpiece stage of a resist curing device
Publication number
20030017713
Publication date
Jan 23, 2003
Ushiodenki Kabushiki Kaisha
Yoshinori Fujiwara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device with process monitor circuit and test method t...
Publication number
20020153525
Publication date
Oct 24, 2002
Mari Shibayama
H01 - BASIC ELECTRIC ELEMENTS