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Yoshinori Fujiyoshi
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Kyoto, JP
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last 30 patents
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Patent Grant
Three-dimensional image reconstruction method, image processor, and...
Patent number
10,541,107
Issue date
Jan 21, 2020
National University Corporation Nagoya University
Yoshinori Fujiyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Specimen stage-moving device for charged-particle beam system
Patent number
8,008,633
Issue date
Aug 30, 2011
Jeol, Ltd.
Yoshinori Fujiyoshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Specimen-holding device for electron microscope
Patent number
5,406,087
Issue date
Apr 11, 1995
Protein Engineering Research Institute
Yoshinori Fujiyoshi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Patents Applications
last 30 patents
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Patent Application
Three-Dimensional Image Reconstruction Method, Image Processor, and...
Publication number
20170278669
Publication date
Sep 28, 2017
National University Corporation Nagoya University
Yoshinori Fujiyoshi
G01 - MEASURING TESTING
Information
Patent Application
Specimen Stage-Moving Device for Charged-Particle Beam System
Publication number
20090230319
Publication date
Sep 17, 2009
JEOL, LTD
Yoshinori Fujiyoshi
H01 - BASIC ELECTRIC ELEMENTS