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Yoshinori Hayamizu
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Annaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor substrate and semiconductor device
Patent number
8,492,879
Issue date
Jul 23, 2013
National University Corporation Tohoku University
Tadahiro Ohmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing silicon single crystal wafer
Patent number
8,187,954
Issue date
May 29, 2012
Shin-Etsu Handotai Co., Ltd.
Yoshinori Hayamizu
C30 - CRYSTAL GROWTH
Information
Patent Grant
Manufacturing process for annealed wafer and annealed wafer
Patent number
7,081,422
Issue date
Jul 25, 2006
Shin-Etsu Handotai Co., Ltd.
Yoshinori Hayamizu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon wafer and silicon epitaxial wafer and production methods th...
Patent number
6,858,094
Issue date
Feb 22, 2005
Shin-Etsu Handotai Co., Ltd.
Wei Feig Qu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon single crystal wafer for epitaxial wafer, epitaxial wafer,...
Patent number
6,548,035
Issue date
Apr 15, 2003
Shin-Etsu Handotai Co., Ltd.
Akihiro Kimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing silicon single crystal, silicon single cry...
Patent number
6,544,332
Issue date
Apr 8, 2003
Shin-Etsu Handotai Co., Ltd.
Makoto Iida
C30 - CRYSTAL GROWTH
Information
Patent Grant
Production method for silicon wafer and silicon wafer
Patent number
6,544,656
Issue date
Apr 8, 2003
Shin-Etsu Handotai Co., Ltd.
Takao Abe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon single crystal wafer, epitaxial silicon wafer, and methods...
Patent number
6,478,883
Issue date
Nov 12, 2002
Shin-Etsu Handotai Co., Ltd.
Masaro Tamatsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Production method for silicon epitaxial wafer
Patent number
6,277,715
Issue date
Aug 21, 2001
Shin-Etsu Handotai Co., Ltd.
Hiroshi Takeno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for detecting heavy metals in silicon wafer bu...
Patent number
6,140,131
Issue date
Oct 31, 2000
Shin-Etsu Handotai Co., Ltd.
Ken Sunakawa
G01 - MEASURING TESTING
Information
Patent Grant
Etching method of silicon wafer surface and etching apparatus of th...
Patent number
5,916,824
Issue date
Jun 29, 1999
Shin-Etsu Handotai Co., Ltd.
Masanori Mayuzumi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ANNEALED WAFER, METHOD FOR PRODUCING ANNEALED WAFER AND METHOD FOR...
Publication number
20120001301
Publication date
Jan 5, 2012
Shin-Etsu Handotai Co., Ltd.
Koji Ebara
C30 - CRYSTAL GROWTH
Information
Patent Application
SEMICONDUCTOR SUBSTRATE AND SEMICONDUCTOR DEVICE
Publication number
20100213516
Publication date
Aug 26, 2010
National University Corporation Tohoku University
Tadahiro Ohmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL WAFER
Publication number
20100105191
Publication date
Apr 29, 2010
Shin-Etsu Handotai Co., Ltd.
Yoshinori Hayamizu
C30 - CRYSTAL GROWTH
Information
Patent Application
Manufacturing process for annealed wafer and annealed wafer
Publication number
20060121291
Publication date
Jun 8, 2006
SHIN-ETSU HANDOTAI CO., LTD.
Yoshinori Hayamizu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Anneal wafer manufacturing mehtod and anneal wafer
Publication number
20030013321
Publication date
Jan 16, 2003
Yoshinori Hayamizu
H01 - BASIC ELECTRIC ELEMENTS