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Yoshinori Ikebe
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Katsuta, JP
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last 30 patents
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Patent Grant
Secondary-ion mass spectrometry apparatus using field limiting method
Patent number
5,278,407
Issue date
Jan 11, 1994
Hitachi, Ltd.
Yoshinori Ikebe
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for neutralizing an accumulated charge on a sp...
Patent number
4,992,661
Issue date
Feb 12, 1991
Hitachi, Ltd.
Hifumi Tamura
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of holding an electrically insulating sample
Patent number
4,833,331
Issue date
May 23, 1989
Hitachi, Ltd.
Yoshinori Ikebe
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for generating metal ions
Patent number
4,774,433
Issue date
Sep 27, 1988
Hitachi, Ltd.
Yoshinori Ikebe
H01 - BASIC ELECTRIC ELEMENTS