Yoshinori Iketaki

Person

Ome, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Super-resolution microscope and modulation optical element
- Patent number 9,507,135
- Issue date Nov 29, 2016
- Olympus Corporation
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Grant
Super-resolution microscope
- Patent number 9,310,595
- Issue date Apr 12, 2016
- Olympus Corporation
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Grant
Nonlinear optical microscope and nonlinear optical microscopy
- Patent number 8,947,658
- Issue date Feb 3, 2015
- Olympus Corporation
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-high resolution microscope
- Patent number 8,699,132
- Issue date Apr 15, 2014
- Olympus Corporation
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Super-resolution microscope
- Patent number 8,536,543
- Issue date Sep 17, 2013
- Olympus Corporation
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Grant
Optical microscope configured to simultaneously irradiate the erase...
- Patent number 8,487,271
- Issue date Jul 16, 2013
- Olympus Corporation
- Eiji Yokoi
- G01 - MEASURING TESTING
Information Patent Grant
Microscopy method and microscope
- Patent number 7,812,967
- Issue date Oct 12, 2010
- Olympus Corporation
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Super-resolution microscope
- Patent number 7,551,350
- Issue date Jun 23, 2009
- Olympus Corporation
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Three dimensional analyzing device
- Patent number 7,304,315
- Issue date Dec 4, 2007
- Japan Science and Technology Agency
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Microscope with wavelength compensation
- Patent number 7,095,556
- Issue date Aug 22, 2006
- Japan Science and Technology Agency
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Grant
Super resolution microscope
- Patent number 6,859,313
- Issue date Feb 22, 2005
- Japan Science and Technology Corporation
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Grant
Double-resonance-absorption microscope
- Patent number 6,844,963
- Issue date Jan 18, 2005
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Super-resolution microscope system and method for illumination
- Patent number 6,667,830
- Issue date Dec 23, 2003
- Japan Science and Technology Corporation
- Yoshinori Iketaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Optical device and a microscope
- Patent number 6,633,432
- Issue date Oct 14, 2003
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Method of microscopic observation
- Patent number 6,184,535
- Issue date Feb 6, 2001
- Olympus Optical Co., Ltd.
- Shingo Kashima
- G02 - OPTICS
Information Patent Grant
Multi-wavelength optical microscope
- Patent number 5,835,262
- Issue date Nov 10, 1998
- Research Development Corporation of Japan
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Grant
Method and apparatus for observing a specimen using an X-ray micros...
- Patent number 5,790,627
- Issue date Aug 4, 1998
- Research Development Corp.
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analyzing surface
- Patent number 5,650,616
- Issue date Jul 22, 1997
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Grant
Reflection type imaging optical system
- Patent number 5,619,382
- Issue date Apr 8, 1997
- Olympus Optical Co., Ltd.
- Mikiko Kato
- G02 - OPTICS
Information Patent Grant
X-ray microscope
- Patent number 5,590,168
- Issue date Dec 31, 1996
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Vacuum optical system
- Patent number 5,533,083
- Issue date Jul 2, 1996
- Olympus Optical Co., Ltd.
- Komei Nagai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample vessel for X-ray microscopes
- Patent number 5,528,646
- Issue date Jun 18, 1996
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray microscope
- Patent number 5,450,463
- Issue date Sep 12, 1995
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Soft X-ray microscope
- Patent number 5,434,901
- Issue date Jul 18, 1995
- Olympus Optical Co., Ltd.
- Komei Nagai
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Vacuum optical system
- Patent number 5,432,831
- Issue date Jul 11, 1995
- Olympus Optical Co., Ltd.
- Komei Nagai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for detecting X-rays
- Patent number 5,352,897
- Issue date Oct 4, 1994
- Olympus Optical Co., Ltd.
- Yoshiaki Horikawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray microscope
- Patent number 5,216,699
- Issue date Jun 1, 1993
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multilayer film reflecting mirror for X-rays
- Patent number 5,163,078
- Issue date Nov 10, 1992
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Swchwarzschild optical system
- Patent number 5,144,497
- Issue date Sep 1, 1992
- Olympus Optical Co., Ltd.
- Mikiko Kato
- G02 - OPTICS
Information Patent Grant
X-ray detector
- Patent number 5,103,100
- Issue date Apr 7, 1992
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SUPER-RESOLUTION MICROSCOPE AND MODULATION OPTICAL ELEMENT
- Publication number 20150034810
- Publication date Feb 5, 2015
- OLYMPUS CORPORATION
- Yoshinori IKETAKI
- G02 - OPTICS
Information Patent Application
SUPER-RESOLUTION MICROSCOPE
- Publication number 20140285881
- Publication date Sep 25, 2014
- OLYMPUS CORPORATION
- Yoshinori IKETAKI
- G02 - OPTICS
Information Patent Application
NONLINEAR OPTICAL MICROSCOPE AND NONLINEAR OPTICAL MICROSCOPY
- Publication number 20130083322
- Publication date Apr 4, 2013
- THE UNIVERSITY OF TOKYO
- Yoshinori IKETAKI
- G02 - OPTICS
Information Patent Application
MICROSCOPE
- Publication number 20110310475
- Publication date Dec 22, 2011
- OLYMPUS CORPORATION
- Yoshinori IKETAKI
- G02 - OPTICS
Information Patent Application
SUPER-RESOLUTION MICROSCOPE
- Publication number 20110140000
- Publication date Jun 16, 2011
- OLYMPUS CORPORATION
- Yoshinori IKETAKI
- G02 - OPTICS
Information Patent Application
OPTICAL MICROSCOPE
- Publication number 20100067102
- Publication date Mar 18, 2010
- OLYMPUS CORPORATION
- Eiji YOKOI
- G02 - OPTICS
Information Patent Application
MICROSCOPE
- Publication number 20100014156
- Publication date Jan 21, 2010
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVING METHOD AND MICROSCOPE
- Publication number 20090261271
- Publication date Oct 22, 2009
- Yoshinori IKETAKI
- G02 - OPTICS
Information Patent Application
MICROSCOPY METHOD AND MICROSCOPE
- Publication number 20080151239
- Publication date Jun 26, 2008
- Yoshinori IKETAKI
- G02 - OPTICS
Information Patent Application
Super-Resolution Microscope
- Publication number 20070291353
- Publication date Dec 20, 2007
- OLYMPUS CORPORATION
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Application
Microscope and its optical controlling method
- Publication number 20070183029
- Publication date Aug 9, 2007
- OLYMPUS CORPORATION
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Application
Three dimensional analyzing device
- Publication number 20060290924
- Publication date Dec 28, 2006
- Japan Science and Technology Agency
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Application
Microscope
- Publication number 20040227101
- Publication date Nov 18, 2004
- Japan Science and Technology Agency
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Application
Microscope
- Publication number 20020167724
- Publication date Nov 14, 2002
- JAPAN SCIENCE AND TECHNOLOGY CORPORATION
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Application
Optical device and a microscope
- Publication number 20020141052
- Publication date Oct 3, 2002
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G01 - MEASURING TESTING
Information Patent Application
Double-resonance-absorption microscope
- Publication number 20010045529
- Publication date Nov 29, 2001
- Yoshinori Iketaki
- G01 - MEASURING TESTING

Yoshinori Iketaki

Person

Patents Grantslast 30 patents

Super-resolution microscope and modulation optical element

Super-resolution microscope

Nonlinear optical microscope and nonlinear optical microscopy

Ultra-high resolution microscope

Super-resolution microscope

Optical microscope configured to simultaneously irradiate the erase...

Microscopy method and microscope

Super-resolution microscope

Three dimensional analyzing device

Microscope with wavelength compensation

Super resolution microscope

Double-resonance-absorption microscope

Super-resolution microscope system and method for illumination

Optical device and a microscope

Method of microscopic observation

Multi-wavelength optical microscope

Method and apparatus for observing a specimen using an X-ray micros...

Apparatus and method for analyzing surface

Reflection type imaging optical system

X-ray microscope

Vacuum optical system

Sample vessel for X-ray microscopes

X-ray microscope

Soft X-ray microscope

Vacuum optical system

Device for detecting X-rays

X-ray microscope

Multilayer film reflecting mirror for X-rays

Swchwarzschild optical system

X-ray detector

Patents Applicationslast 30 patents

SUPER-RESOLUTION MICROSCOPE AND MODULATION OPTICAL ELEMENT

SUPER-RESOLUTION MICROSCOPE

NONLINEAR OPTICAL MICROSCOPE AND NONLINEAR OPTICAL MICROSCOPY

MICROSCOPE

SUPER-RESOLUTION MICROSCOPE

OPTICAL MICROSCOPE

MICROSCOPE

SAMPLE OBSERVING METHOD AND MICROSCOPE

MICROSCOPY METHOD AND MICROSCOPE

Super-Resolution Microscope

Microscope and its optical controlling method

Three dimensional analyzing device

Microscope

Microscope

Optical device and a microscope

Double-resonance-absorption microscope