Yoshinori KIKUCHI

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Hirosaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electrical connecting apparatus
- Patent number 11,067,602
- Issue date Jul 20, 2021
- Kabushiki Kaisha Nihon Micronics
- Toshiyuki Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card holder
- Patent number 10,989,739
- Issue date Apr 27, 2021
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and inspection device
- Patent number 9,638,746
- Issue date May 2, 2017
- Kabushiki Kaisha Nihon Micronics
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and testing apparatus
- Patent number 9,110,098
- Issue date Aug 18, 2015
- Kabushiki Kaisha Nihon Micronics
- Katsushi Mikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 8,508,247
- Issue date Aug 13, 2013
- Kabushiki Kaisha Nihon Micronics
- Katsuji Hoshi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,843,204
- Issue date Nov 30, 2010
- Kabushiki Kaisha Nihon Micronics
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,468,610
- Issue date Dec 23, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji Miyagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20200191829
- Publication date Jun 18, 2020
- KABUSHI KAISHA NIHON MICRONICS
- TOSHIYUKI KUDO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD HOLDER
- Publication number 20200103442
- Publication date Apr 2, 2020
- Kabushiki Kaisha Nihon Micronics
- HIDEKI HIROTA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND INSPECTION DEVICE
- Publication number 20140145741
- Publication date May 29, 2014
- Kabushiki Kaisha Nihon Micronics
- Yoshiro NAKATA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND TESTING APPARATUS
- Publication number 20140028341
- Publication date Jan 30, 2014
- Katsushi MIKUNI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20100194416
- Publication date Aug 5, 2010
- Kabushiki Kaisha Nihon Micronics
- Katsuji HOSHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20090212800
- Publication date Aug 27, 2009
- Kabushiki Kaisha Nihon Micronics
- Hidehiro KIYOFUJI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20080122466
- Publication date May 29, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji MIYAGI
- G01 - MEASURING TESTING