Yoshinori MOMONOI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 10,714,304
- Issue date Jul 14, 2020
- HITACHI HIGH-TECH CORPORATION
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,665,420
- Issue date May 26, 2020
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,546,715
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Shahedul Hoque
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement device, calibration method of measurement device, and c...
- Patent number 10,438,771
- Issue date Oct 8, 2019
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,340,115
- Issue date Jul 2, 2019
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,217,604
- Issue date Feb 26, 2019
- Hitachi High-Technologies Corporation
- Makoto Sakakibara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,186,399
- Issue date Jan 22, 2019
- Hitachi High-Technologies Corporation
- Mayuka Osaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Height measurement device and charged particle beam device
- Patent number 10,101,150
- Issue date Oct 16, 2018
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,892,887
- Issue date Feb 13, 2018
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measuring apparatus, pattern measuring method, and computer...
- Patent number 9,521,372
- Issue date Dec 13, 2016
- Hitachi High-Technologies Corporation
- Yoshinori Momonoi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning electron microscope
- Patent number 9,472,376
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device and semiconductor inspection method...
- Patent number 9,123,504
- Issue date Sep 1, 2015
- Hitachi High-Technologies Corporation
- Atsuko Yamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20190304740
- Publication date Oct 3, 2019
- Hitachi High-Technologies Corporation
- Muneyuki FUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20190295815
- Publication date Sep 26, 2019
- Hitachi High-Technologies Corporation
- Yasunori TAKASUGI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180286629
- Publication date Oct 4, 2018
- Hitachi High-Technologies Corporation
- Makoto SAKAKIBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20180269026
- Publication date Sep 20, 2018
- Hitachi High-Technologies Corporation
- Shahedul HOQUE
- G02 - OPTICS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20180138010
- Publication date May 17, 2018
- Hitachi High-Technologies Corporation
- Muneyuki FUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Height Measurement Device and Charged Particle Beam Device
- Publication number 20170343340
- Publication date Nov 30, 2017
- Hitachi High-Tecnologies Corporation
- Hiroki KAWADA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20170301513
- Publication date Oct 19, 2017
- Hitachi High-Technologies Corporation
- Mayuka OSAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20170110285
- Publication date Apr 20, 2017
- Hitachi High-Technologies Corporation
- Muneyuki FUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT DEVICE, CALIBRATION METHOD OF MEASUREMENT DEVICE, AND C...
- Publication number 20170092462
- Publication date Mar 30, 2017
- Hitachi High-Technologies Corporation
- Michio HATANO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150008322
- Publication date Jan 8, 2015
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- G01 - MEASURING TESTING
Information Patent Application
PATTERN MEASURING APPARATUS, PATTERN MEASURING METHOD, AND COMPUTER...
- Publication number 20130321610
- Publication date Dec 5, 2013
- Yoshinori Momonoi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND SEMICONDUCTOR INSPECTION METHOD...
- Publication number 20120098954
- Publication date Apr 26, 2012
- Atsuko Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING

Yoshinori MOMONOI

Person

Patents Grantslast 30 patents

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam device

Measurement device, calibration method of measurement device, and c...

Charged particle beam apparatus

Charged particle beam apparatus

Scanning electron microscope

Height measurement device and charged particle beam device

Charged particle beam apparatus

Pattern measuring apparatus, pattern measuring method, and computer...

Scanning electron microscope

Semiconductor inspection device and semiconductor inspection method...

Patents Applicationslast 30 patents

Charged Particle Beam Apparatus

Charged Particle Beam Apparatus

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Device

Charged Particle Beam Apparatus

Height Measurement Device and Charged Particle Beam Device

SCANNING ELECTRON MICROSCOPE

Charged Particle Beam Apparatus

MEASUREMENT DEVICE, CALIBRATION METHOD OF MEASUREMENT DEVICE, AND C...

SCANNING ELECTRON MICROSCOPE

PATTERN MEASURING APPARATUS, PATTERN MEASURING METHOD, AND COMPUTER...

SEMICONDUCTOR INSPECTION DEVICE AND SEMICONDUCTOR INSPECTION METHOD...