Yoshinori NAKAMURA

Follow

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen measurement apparatus and method performed in specimen mea...
- Patent number 12,188,951
- Issue date Jan 7, 2025
- Sysmex Corporation
- Jun Inagaki
- G01 - MEASURING TESTING
Information Patent Grant
Sample measuring apparatus and sample measuring method
- Patent number 11,422,143
- Issue date Aug 23, 2022
- Sysmex Corporation
- Takashi Yamato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE MEASURING METHOD, CARTRIDGE, AND SAMPLE MEASURING DEVICE
- Publication number 20230204615
- Publication date Jun 29, 2023
- SYSMEX CORPORATION
- Kohei ODA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN MEASUREMENT APPARATUS AND METHOD PERFORMED IN SPECIMEN MEA...
- Publication number 20200103425
- Publication date Apr 2, 2020
- SYSMEX CORPORATION
- Jun INAGAKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
- Publication number 20190265264
- Publication date Aug 29, 2019
- SYSMEX CORPORATION
- Takashi YAMATO
- G01 - MEASURING TESTING