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Yoshinori NEGISHI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 10,768,189
    • Issue date Sep 8, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Flow Cell and Automatic Analysis Device
    • Publication number 20230054088
    • Publication date Feb 23, 2023
    • Hitachi High-Tech Corporation
    • Yoshinori NEGISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20160334428
    • Publication date Nov 17, 2016
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING