TREA

Yoshinori Numata

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Defect inspecting apparatus
    • Patent number 7,129,727
    • Issue date Oct 31, 2006
    • Hitachi High-Technologies Corporation
    • Tsutomu Saito
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Defect inspecting apparatus
    • Publication number 20060087330
    • Publication date Apr 27, 2006
    • Hitachi High-Technologies Corporation
    • Tsutomu Saito
    • G01 - MEASURING TESTING