Yoshinori Obata

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method for semiconductor memory
- Patent number 7,982,466
- Issue date Jul 19, 2011
- Fujitsu Semiconductor Limited
- Yukinobu Hikosaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,913,970
- Issue date Jul 5, 2005
- Fujitsu Limited
- Kenichi Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,509,593
- Issue date Jan 21, 2003
- Fujitsu Limited
- Kenichi Inoue
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Inspection method for semiconductor memory
- Publication number 20070058416
- Publication date Mar 15, 2007
- FUJITSU LIMITED
- Yukinobu Hikosaka
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20030080364
- Publication date May 1, 2003
- FUJITSU LIMITED
- Kenichi Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20020011616
- Publication date Jan 31, 2002
- FUJITSU LIMITED
- Kenichi Inoue
- H01 - BASIC ELECTRIC ELEMENTS