Yoshio BAMBA

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical type inspection apparatus, inspection system and the wafer...
- Patent number 9,097,686
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
- Patent number 8,625,089
- Issue date Jan 7, 2014
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
- Patent number 7,876,431
- Issue date Jan 25, 2011
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
- Patent number 7,589,833
- Issue date Sep 15, 2009
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL TYPE INSPECTION APPARATUS, INSPECTION SYSTEM AND THE WAFER...
- Publication number 20140192352
- Publication date Jul 10, 2014
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...
- Publication number 20110075136
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Yoshio BAMBA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...
- Publication number 20090303470
- Publication date Dec 10, 2009
- Hitachi High-Technologies Corporation
- Yoshio BAMBA
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection apparatus and foreign matter inspection m...
- Publication number 20080088848
- Publication date Apr 17, 2008
- Hitachi High-Technologies Corporation
- Yoshio BAMBA
- G01 - MEASURING TESTING