Yoshio KOMOTO

Person

Gunma, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test wafer unit and test system
- Patent number 8,749,260
- Issue date Jun 10, 2014
- Advantest Corporation
- Yasuo Tokunaga
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for manufacturing a packaged device
- Patent number 8,667,669
- Issue date Mar 11, 2014
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method and manufacturing method for testing a...
- Patent number 8,652,857
- Issue date Feb 18, 2014
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Test system and write wafer
- Patent number 8,624,620
- Issue date Jan 7, 2014
- Advantest Corporation
- Yasuo Tokunaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe wafer, probe device, and testing system
- Patent number 8,427,187
- Issue date Apr 23, 2013
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Test system and probe apparatus
- Patent number 8,410,807
- Issue date Apr 2, 2013
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Test wafer unit and test system
- Patent number 8,289,040
- Issue date Oct 16, 2012
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus and test apparatus
- Patent number 8,253,428
- Issue date Aug 28, 2012
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Probe wafer, probe device, and testing system
- Patent number 8,134,379
- Issue date Mar 13, 2012
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD
- Publication number 20120214261
- Publication date Aug 23, 2012
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING APPARATUS, MANUFACTURING METHOD AND PACKAGED DEVICE
- Publication number 20120205143
- Publication date Aug 16, 2012
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST WAFER UNIT AND TEST SYSTEM
- Publication number 20110133768
- Publication date Jun 9, 2011
- Advantest Corporation
- Yasuo TOKUNAGA
- G01 - MEASURING TESTING
Information Patent Application
PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM
- Publication number 20110121848
- Publication date May 26, 2011
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND WRITE WAFER
- Publication number 20110115519
- Publication date May 19, 2011
- Advantest Corporation
- Yasuo TOKUNAGA
- G01 - MEASURING TESTING
Information Patent Application
PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM
- Publication number 20110109337
- Publication date May 12, 2011
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST WAFER UNIT AND TEST SYSTEM
- Publication number 20110095777
- Publication date Apr 28, 2011
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND TEST APPARATUS
- Publication number 20110074456
- Publication date Mar 31, 2011
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND PROBE APPARATUS
- Publication number 20110062979
- Publication date Mar 17, 2011
- Advantest Corporation
- Yoshiharu UMEMURA
- G01 - MEASURING TESTING

Yoshio KOMOTO

Person

Patents Grantslast 30 patents

Test wafer unit and test system

Apparatus and method for manufacturing a packaged device

Test apparatus, test method and manufacturing method for testing a...

Test system and write wafer

Probe wafer, probe device, and testing system

Test system and probe apparatus

Test wafer unit and test system

Probe apparatus and test apparatus

Probe wafer, probe device, and testing system

Patents Applicationslast 30 patents

TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD

MANUFACTURING APPARATUS, MANUFACTURING METHOD AND PACKAGED DEVICE

TEST WAFER UNIT AND TEST SYSTEM

PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM

TEST SYSTEM AND WRITE WAFER

PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM

TEST WAFER UNIT AND TEST SYSTEM

PROBE APPARATUS AND TEST APPARATUS

TEST SYSTEM AND PROBE APPARATUS