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Yoshio Moriya
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Kawasaki, JP
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last 30 patents
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Patent Grant
Measuring instrument, probe for the same, and measuring method
Patent number
6,173,504
Issue date
Jan 16, 2001
Mitutoyo Corporation
Yukiharu Ohtsuka
G01 - MEASURING TESTING
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Patent Grant
Measuring instrument, probe for the same, and measuring method
Patent number
6,065,220
Issue date
May 23, 2000
Mitutoyo Corporation
Yukiharu Ohtsuka
G01 - MEASURING TESTING