Yoshio Sakitani

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Ohimachi, JP

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Patents Grantslast 30 patents

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Electron beam measuring apparatus
- Patent number 5,117,111
- Issue date May 26, 1992
- Hitachi, Ltd.
- Kazumitsu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
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Position detecting system
- Patent number 4,589,773
- Issue date May 20, 1986
- Nippon Telegraph & Telephone Public Corporation
- Satoshi Ido
- G01 - MEASURING TESTING
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Specimen supporting device
- Patent number 4,520,421
- Issue date May 28, 1985
- Hitachi, Ltd.
- Yoshio Sakitani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Apparatus for measuring specimen potential in electron microscope
- Patent number 4,355,232
- Issue date Oct 19, 1982
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
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Field emission electron gun with anode heater and plural exhausts
- Patent number 4,295,072
- Issue date Oct 13, 1981
- Hitachi, Ltd.
- Hideo Todokoro
- H01 - BASIC ELECTRIC ELEMENTS
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Field emission electron gun
- Patent number 4,274,035
- Issue date Jun 16, 1981
- Hitachi, Ltd.
- Satoru Fukuhara
- H01 - BASIC ELECTRIC ELEMENTS
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Two-directional piezoelectric driven fine adjusting device
- Patent number 4,163,168
- Issue date Jul 31, 1979
- Hitachi, Ltd.
- Isao Ishikawa
- G05 - CONTROLLING REGULATING