Yoshio Saruki

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical interferometric measuring instrument and laser interference...
- Patent number 6,697,162
- Issue date Feb 24, 2004
- Mitutoyo Corporation
- Hisayoshi Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Surface profile measurement apparatus
- Patent number 6,646,748
- Issue date Nov 11, 2003
- Mitutoyo Corporation
- Taizo Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument, probe for the same, and measuring method
- Patent number 6,173,504
- Issue date Jan 16, 2001
- Mitutoyo Corporation
- Yukiharu Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument, probe for the same, and measuring method
- Patent number 6,065,220
- Issue date May 23, 2000
- Mitutoyo Corporation
- Yukiharu Ohtsuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surface profile measurement apparatus
- Publication number 20020018215
- Publication date Feb 14, 2002
- Mitutoyo Corporation
- Taizo Nakamura
- G01 - MEASURING TESTING