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Yoshio Shinoda
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Tokyo, JP
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last 30 patents
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Patent Grant
Device and method for thermal analysis
Patent number
9,939,329
Issue date
Apr 10, 2018
Netzsch-Gerätebau GmbH
Yoshio Shinoda
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Device And Method For Thermal Analysis
Publication number
20160054181
Publication date
Feb 25, 2016
Netzsch-Gerätebau GmbH
Yoshio Shinoda
G01 - MEASURING TESTING