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Yoshio Torii
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Tokyo, JP
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last 30 patents
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Patent Grant
Atomic beam generating method and device
Patent number
6,495,822
Issue date
Dec 17, 2002
Japan Science and Technology Corporation
Takuya Hirano
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
ATOMIC BEAM GENERATING METHOD AND DEVICE
Publication number
20020134931
Publication date
Sep 26, 2002
Takuya Hirano
G01 - MEASURING TESTING