Yoshio Tsuji

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Substrate inspection device and substrate inspecting method
- Patent number 7,202,690
- Issue date Apr 10, 2007
- Nidec-Read Corporation
- Masami Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Circuit based testing apparatus and method for testing a circuit board
- Patent number 7,112,967
- Issue date Sep 26, 2006
- Nidec-Read Corporation
- Yoshio Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board testing apparatus and method for testing a circuit board
- Patent number 6,777,949
- Issue date Aug 17, 2004
- Nidec-Read Corporation
- Yoshio Tsuji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Substrate inspection device and substrate inspecting method
- Publication number 20060017452
- Publication date Jan 26, 2006
- Masami Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Circuit board testing apparatus and method for testing a circuit board
- Publication number 20050017729
- Publication date Jan 27, 2005
- Yoshio Tsuji
- G01 - MEASURING TESTING
Information Patent Application
Circuit board testing apparatus and method for testing a circuit board
- Publication number 20020113598
- Publication date Aug 22, 2002
- Yoshio Tsuji
- G01 - MEASURING TESTING