TREA

Yoshio Yamada

Follow

Person

  • Nagano, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe unit
    • Patent number 10,082,525
    • Issue date Sep 25, 2018
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe unit
    • Patent number 9,702,905
    • Issue date Jul 11, 2017
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact structure unit
    • Patent number 9,373,900
    • Issue date Jun 21, 2016
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card for a semiconductor wafer
    • Patent number 8,456,184
    • Issue date Jun 4, 2013
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 8,149,006
    • Issue date Apr 3, 2012
    • NHK Spring Co., Ltd.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card electrically connectable with a semiconductor wafer
    • Patent number 8,149,008
    • Issue date Apr 3, 2012
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Parallelism adjusting mechanism of probe card
    • Patent number 8,049,525
    • Issue date Nov 1, 2011
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 8,018,242
    • Issue date Sep 13, 2011
    • NHK Spring Co., Ltd.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 7,898,272
    • Issue date Mar 1, 2011
    • NHK Spring Co., Ltd.
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 7,795,892
    • Issue date Sep 14, 2010
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical test probe provided with a signal transmitting wire havi...
    • Patent number 6,655,983
    • Issue date Dec 2, 2003
    • NHK SPRING CO., LTD.
    • Shigeki Ishikawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Holder of electroconductive contactor, and method for producing the...
    • Patent number 6,642,728
    • Issue date Nov 4, 2003
    • NHK Spring Co., Ltd.
    • Masami Kudo
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE UNIT
    • Publication number 20170299631
    • Publication date Oct 19, 2017
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOCKET ATTACHMENT STRUCTURE AND SPRING MEMBER
    • Publication number 20150139722
    • Publication date May 21, 2015
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PROBE UNIT
    • Publication number 20140247065
    • Publication date Sep 4, 2014
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT STRUCTURE UNIT
    • Publication number 20140162503
    • Publication date Jun 12, 2014
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD
    • Publication number 20100219852
    • Publication date Sep 2, 2010
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD
    • Publication number 20100164518
    • Publication date Jul 1, 2010
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20100052707
    • Publication date Mar 4, 2010
    • NHK Spring Co.,Ltd
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    PARALLELISM ADJUSTING MECHANISM OF PROBE CARD
    • Publication number 20100001752
    • Publication date Jan 7, 2010
    • NHK SPRING CO., LTD.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20100001748
    • Publication date Jan 7, 2010
    • NHK Spring Co., Ltd.
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20090219043
    • Publication date Sep 3, 2009
    • NHK SPRING CO., LTD.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20090167335
    • Publication date Jul 2, 2009
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING