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Yoshiro Fukasawa
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Tokyo, JP
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last 30 patents
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Patent Grant
Ratio type double-beam spectrophotometer
Patent number
4,583,853
Issue date
Apr 22, 1986
Japan Spectroscopic Co., Ltd.
Hirohumi Maeda
G01 - MEASURING TESTING
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Patent Grant
Spectrophotometer
Patent number
4,577,966
Issue date
Mar 25, 1986
Japan Spectroscopic Co., Ltd.
Yoshiro Fukasawa
G01 - MEASURING TESTING
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Patent Grant
Spectrophotometer
Patent number
4,577,106
Issue date
Mar 18, 1986
Japan Spectroscopic Co., Ltd.
Yoshiro Fukasawa
G01 - MEASURING TESTING