Yoshiro Goto

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage and displacement measuring apparatus and probe
- Patent number 5,999,005
- Issue date Dec 7, 1999
- Fujitsu Limited
- Akira Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Production of optical module assembly
- Patent number 5,916,458
- Issue date Jun 29, 1999
- Fujitsu Limited
- Hitoshi Komoriya
- G02 - OPTICS
Information Patent Grant
Voltage and displacement measuring apparatus and probe
- Patent number 5,677,635
- Issue date Oct 14, 1997
- Fujitsu Limited
- Akira Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Signal measuring apparatus and signal measuring method
- Patent number 5,550,479
- Issue date Aug 27, 1996
- Fujitsu Limited
- Shinichi Wakana
- G01 - MEASURING TESTING
Information Patent Grant
Probing device and system for testing an integrated circuit
- Patent number 5,331,275
- Issue date Jul 19, 1994
- Fujitsu Limited
- Kazuyuki Ozaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Strobo electron beam apparatus
- Patent number 4,755,749
- Issue date Jul 5, 1988
- Fujitsu Limited
- Kazuo Ookubo
- G01 - MEASURING TESTING
Information Patent Grant
Exposure system and method using an electron beam
- Patent number 4,484,077
- Issue date Nov 20, 1984
- Fujitsu Limited
- Seigo Igaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Back-scattered electron detector for use in an electron microscope...
- Patent number 4,177,379
- Issue date Dec 4, 1979
- Fujitsu Limited
- Yasuo Furukawa
- G01 - MEASURING TESTING

Yoshiro Goto

Person

Patents Grantslast 30 patents

Voltage and displacement measuring apparatus and probe

Production of optical module assembly

Voltage and displacement measuring apparatus and probe

Signal measuring apparatus and signal measuring method

Probing device and system for testing an integrated circuit

Strobo electron beam apparatus

Exposure system and method using an electron beam

Back-scattered electron detector for use in an electron microscope...