Yoshiro NAKATA

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor module, electrical connector, and inspection apparatus
- Patent number 10,101,365
- Issue date Oct 16, 2018
- Kabushiki Kaisha Nihon Micronics
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and inspection device
- Patent number 9,638,746
- Issue date May 2, 2017
- Kabushiki Kaisha Nihon Micronics
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and probe base plate
- Patent number 9,442,160
- Issue date Sep 13, 2016
- Kabushiki Kaisha Nihon Micronics
- Yoshiro Nakata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MODULE, ELECTRICAL CONNECTOR, AND INSPECTION APPARATUS
- Publication number 20170168091
- Publication date Jun 15, 2017
- Kabushiki Kaisha Nihon Micronics
- Yoshiro NAKATA
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND PROBE BASE PLATE
- Publication number 20140300383
- Publication date Oct 9, 2014
- Kabushiki Kaisha Nihon Micronics
- Yoshiro NAKATA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND INSPECTION DEVICE
- Publication number 20140145741
- Publication date May 29, 2014
- Kabushiki Kaisha Nihon Micronics
- Yoshiro NAKATA
- G01 - MEASURING TESTING