Yoshiro Shiokawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Device for measuring mean free path, vacuum gauge, and method for m...
- Patent number 8,436,295
- Issue date May 7, 2013
- Canon Anelva Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Grant
Ion detector for mass spectrometry, method for detecting ion, and m...
- Patent number 8,410,415
- Issue date Apr 2, 2013
- Canon Anelva Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 8,324,568
- Issue date Dec 4, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry and mass spectrometer used for the same
- Patent number 8,309,917
- Issue date Nov 13, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Internal standard material, resin composition, and measurement method
- Patent number 8,164,051
- Issue date Apr 24, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Mass spectrometer system and mass spectrometry method
- Patent number 8,049,166
- Issue date Nov 1, 2011
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 7,952,069
- Issue date May 31, 2011
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Q-pole type mass spectrometer
- Patent number 7,842,919
- Issue date Nov 30, 2010
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry apparatus
- Patent number 7,202,474
- Issue date Apr 10, 2007
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry method
- Patent number 7,164,121
- Issue date Jan 16, 2007
- Anelva Corporation
- Yoshiki Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Ion attachment mass spectrometry apparatus
- Patent number 7,084,397
- Issue date Aug 1, 2006
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 7,015,461
- Issue date Mar 21, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus
- Patent number 7,005,634
- Issue date Feb 28, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflection type ion attachment mass spectrometry apparatus
- Patent number 6,800,850
- Issue date Oct 5, 2004
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 6,800,848
- Issue date Oct 5, 2004
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry apparatus, ionization apparatus, a...
- Patent number 6,768,108
- Issue date Jul 27, 2004
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 6,635,868
- Issue date Oct 21, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization method for mass spectrometry and mass spectrometry appar...
- Patent number 6,590,205
- Issue date Jul 8, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus and ionization method for mass spectrometry
- Patent number 6,559,443
- Issue date May 6, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Halide compound mass spectrometry method and mass spectrometry appa...
- Patent number 6,507,020
- Issue date Jan 14, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source for ion attachment mass spectrometry apparatus
- Patent number 6,479,814
- Issue date Nov 12, 2002
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface treated vacuum material and a vacuum chamber having an inte...
- Patent number 6,399,213
- Issue date Jun 4, 2002
- Anelva Corporation
- Yoshiro Shiokawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for the surface treatment of vacuum materials and surface tr...
- Patent number 6,316,052
- Issue date Nov 13, 2001
- Anelva Corporation
- Yoshiro Shiokawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for the treatment of stainless steel surfaces
- Patent number 5,916,388
- Issue date Jun 29, 1999
- Anelva Corporation
- Yoshiro Shiokawa
- C21 - METALLURGY OF IRON
Information Patent Grant
Element analyzing apparatus
- Patent number 4,785,173
- Issue date Nov 15, 1988
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic spectrometer for identifying element conditions of a sam...
- Patent number 4,752,685
- Issue date Jun 21, 1988
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer capable of analyzing an insulator
- Patent number 4,652,753
- Issue date Mar 24, 1987
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auger electron spectrometer capable of attaining a high resolution
- Patent number 4,639,597
- Issue date Jan 27, 1987
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing apparatus capable of analyzing a surface at a high resolu...
- Patent number 4,562,352
- Issue date Dec 31, 1985
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR M...
- Publication number 20120235034
- Publication date Sep 20, 2012
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Application
ION DETECTOR FOR MASS SPECTROMETRY, METHOD FOR DETECTING ION, AND M...
- Publication number 20120097847
- Publication date Apr 26, 2012
- Canon ANELVA Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20100243884
- Publication date Sep 30, 2010
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER SYSTEM AND MASS SPECTROMETRY METHOD
- Publication number 20100163723
- Publication date Jul 1, 2010
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME
- Publication number 20100163722
- Publication date Jul 1, 2010
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20090272894
- Publication date Nov 5, 2009
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ATTACHMENT MASS SPECTROMETER AND ION ATTACHMENT MASS SPECTROMET...
- Publication number 20090266979
- Publication date Oct 29, 2009
- CANON ANELVA TECHNIX CORPORATION
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERNAL STANDARD MATERIAL, RESIN COMPOSITION, AND MEASUREMENT METHOD
- Publication number 20090266981
- Publication date Oct 29, 2009
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Q-pole type mass spectrometer
- Publication number 20080251717
- Publication date Oct 16, 2008
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Q-pole type mass spectrometer
- Publication number 20070114393
- Publication date May 24, 2007
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Attachment Mass Spectrometry Apparatus
- Publication number 20060169888
- Publication date Aug 3, 2006
- ANELVA CORPORATION
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion attachment mass spectrometry apparatus
- Publication number 20040251408
- Publication date Dec 16, 2004
- ANELVA CORPORATION
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Q-pole type mass spectrometer
- Publication number 20040245459
- Publication date Dec 9, 2004
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reflection type ion attachment mass spectrometry apparatus
- Publication number 20040084616
- Publication date May 6, 2004
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion attachment mass spectrometry method
- Publication number 20040079876
- Publication date Apr 29, 2004
- Yoshiki Hirano
- G01 - MEASURING TESTING
Information Patent Application
Ion attachment mass spectrometry apparatus, ionization apparatus, a...
- Publication number 20040011955
- Publication date Jan 22, 2004
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization apparatus
- Publication number 20020139930
- Publication date Oct 3, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20020084408
- Publication date Jul 4, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization apparatus and ionization method for mass spectrometry
- Publication number 20020053636
- Publication date May 9, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry apparatus
- Publication number 20020036263
- Publication date Mar 28, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Q-pole type mass spectrometer
- Publication number 20020027196
- Publication date Mar 7, 2002
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization method for mass spectrometry and mass spectrometry appar...
- Publication number 20020020813
- Publication date Feb 21, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20010048074
- Publication date Dec 6, 2001
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface treated vacuum material and a vacuum chamber having an inte...
- Publication number 20010044033
- Publication date Nov 22, 2001
- Yoshiro Shiokawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Ion source for ion attachment mass spectrometry apparatus
- Publication number 20010023922
- Publication date Sep 27, 2001
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Halide compound mass spectrometry method and mass spectrometry appa...
- Publication number 20010004102
- Publication date Jun 21, 2001
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Yoshiro Shiokawa

Person

Patents Grantslast 30 patents

Device for measuring mean free path, vacuum gauge, and method for m...

Ion detector for mass spectrometry, method for detecting ion, and m...

Mass spectrometer and mass spectrometry method

Mass spectrometry and mass spectrometer used for the same

Internal standard material, resin composition, and measurement method

Mass spectrometer system and mass spectrometry method

Mass spectrometer and mass spectrometry method

Q-pole type mass spectrometer

Ion attachment mass spectrometry apparatus

Ion attachment mass spectrometry method

Ion attachment mass spectrometry apparatus

Method and apparatus for ion attachment mass spectrometry

Ionization apparatus

Reflection type ion attachment mass spectrometry apparatus

Method and apparatus for ion attachment mass spectrometry

Ion attachment mass spectrometry apparatus, ionization apparatus, a...

Mass spectrometry apparatus

Ionization method for mass spectrometry and mass spectrometry appar...

Ionization apparatus and ionization method for mass spectrometry

Halide compound mass spectrometry method and mass spectrometry appa...

Ion source for ion attachment mass spectrometry apparatus

Surface treated vacuum material and a vacuum chamber having an inte...

Method for the surface treatment of vacuum materials and surface tr...

Method and apparatus for the treatment of stainless steel surfaces

Element analyzing apparatus

Electronic spectrometer for identifying element conditions of a sam...

Mass spectrometer capable of analyzing an insulator

Auger electron spectrometer capable of attaining a high resolution

Analyzing apparatus capable of analyzing a surface at a high resolu...

Patents Applicationslast 30 patents

DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR M...

ION DETECTOR FOR MASS SPECTROMETRY, METHOD FOR DETECTING ION, AND M...

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

MASS SPECTROMETER SYSTEM AND MASS SPECTROMETRY METHOD

MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

ION ATTACHMENT MASS SPECTROMETER AND ION ATTACHMENT MASS SPECTROMET...

INTERNAL STANDARD MATERIAL, RESIN COMPOSITION, AND MEASUREMENT METHOD

Q-pole type mass spectrometer

Q-pole type mass spectrometer

Ion Attachment Mass Spectrometry Apparatus

Ion attachment mass spectrometry apparatus

Q-pole type mass spectrometer

Reflection type ion attachment mass spectrometry apparatus

Ion attachment mass spectrometry method

Ion attachment mass spectrometry apparatus, ionization apparatus, a...

Ionization apparatus

Method and apparatus for ion attachment mass spectrometry

Ionization apparatus and ionization method for mass spectrometry

Mass spectrometry apparatus

Q-pole type mass spectrometer

Ionization method for mass spectrometry and mass spectrometry appar...

Method and apparatus for ion attachment mass spectrometry

Surface treated vacuum material and a vacuum chamber having an inte...

Ion source for ion attachment mass spectrometry apparatus

Halide compound mass spectrometry method and mass spectrometry appa...