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Katsuta, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Manufacturing method of concave diffraction grating, concave diffra...
Patent number
11,391,871
Issue date
Jul 19, 2022
HITACHI HIGH-TECH CORPORATION
Kenta Yaegashi
G01 - MEASURING TESTING
Information
Patent Grant
Concave diffraction grating, method for producing the same, and opt...
Patent number
11,366,255
Issue date
Jun 21, 2022
HITACHI HIGH-TECH CORPORATION
Takanori Aono
G01 - MEASURING TESTING
Information
Patent Grant
Curved grating, method for manufacturing the same, and optical device
Patent number
9,945,993
Issue date
Apr 17, 2018
Hitachi High-Technologies Corporation
Takanori Aono
G02 - OPTICS
Information
Patent Grant
Curved face diffraction grating fabrication method, curved face dif...
Patent number
9,709,714
Issue date
Jul 18, 2017
Hitachi High-Technologies Corporation
Takanori Aono
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Phase shift mask, method of forming asymmetric pattern, method of m...
Patent number
9,390,934
Issue date
Jul 12, 2016
Hitachi High-Technologies Corporation
Kazuyuki Kakuta
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure device and method for producing structure
Patent number
9,104,118
Issue date
Aug 11, 2015
Hitachi High-Technologies Corporation
Naoya Nakai
G02 - OPTICS
Information
Patent Grant
Spectrophotometer
Patent number
7,050,164
Issue date
May 23, 2006
Hitachi, Ltd.
Kouhei Kabuki
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer and graphite tube type cuvette...
Patent number
5,822,059
Issue date
Oct 13, 1998
Hitachi Ltd.
Hayato Tobe
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device using chemical combustion flame
Patent number
5,801,827
Issue date
Sep 1, 1998
Hitachi, Ltd.
Kazuo Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer and atomic absorption spectroch...
Patent number
5,786,887
Issue date
Jul 28, 1998
Hitachi, Ltd.
Yoshisada Ebata
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer having functions of both a double-monochromater a...
Patent number
4,981,357
Issue date
Jan 1, 1991
Hitachi, Ltd.
Sadao Minakawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for Manufacturing Concave Diffraction Grating, and Optical D...
Publication number
20230236345
Publication date
Jul 27, 2023
Hitachi High-Tech Corporation
Takanori AONO
G02 - OPTICS
Information
Patent Application
Concave Diffraction Grating and Optical Device
Publication number
20230079523
Publication date
Mar 16, 2023
Hitachi High-Tech Corporation
Takanori AONO
G02 - OPTICS
Information
Patent Application
DIFFRACTION GRATING, METHOD FOR MANUFACTURING DIFFRACTION GRATING,...
Publication number
20220252768
Publication date
Aug 11, 2022
HITACHI HIGH-TECH CORPORATION
Kenta Yaegashi
G02 - OPTICS
Information
Patent Application
SPECTROPHOTOMETER, SPECTROMETER, AND METHOD OF MANUFACTURING SPECTR...
Publication number
20220034792
Publication date
Feb 3, 2022
HITACHI HIGH-TECH CORPORATION
Kenta YAEGASHI
G01 - MEASURING TESTING
Information
Patent Application
Method and Device for Manufacturing Concave Diffraction Grating, an...
Publication number
20210318473
Publication date
Oct 14, 2021
Hitachi High-Tech Corporation
Kenta YAEGASHI
G02 - OPTICS
Information
Patent Application
CONCAVE DIFFRACTION GRATING, METHOD FOR PRODUCING THE SAME, AND OPT...
Publication number
20210271008
Publication date
Sep 2, 2021
HITACHI HIGH-TECH CORPORATION
Takanori AONO
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF CONCAVE DIFFRACTION GRATING, CONCAVE DIFFRA...
Publication number
20200278481
Publication date
Sep 3, 2020
Hitachi High-Technologies Corporation
Kenta YAEGASHI
G01 - MEASURING TESTING
Information
Patent Application
Curved Grating, Method for Manufacturing the Same, and Optical Device
Publication number
20160282526
Publication date
Sep 29, 2016
Hitachi High-Technologies Corporation
Takanori AONO
G02 - OPTICS
Information
Patent Application
CURVED FACE DIFFRACTION GRATING FABRICATION METHOD, CURVED FACE DIF...
Publication number
20150192713
Publication date
Jul 9, 2015
Hitachi High-Technologies Corporation
Takanori Aono
B32 - LAYERED PRODUCTS
Information
Patent Application
EXPOSURE DEVICE AND METHOD FOR PRODUCING STRUCTURE
Publication number
20140327897
Publication date
Nov 6, 2014
Hitachi High-Technologies Corporation
Naoya Nakai
G02 - OPTICS
Information
Patent Application
PHASE SHIFT MASK, METHOD OF FORMING ASYMMETRIC PATTERN, METHOD OF M...
Publication number
20140302679
Publication date
Oct 9, 2014
Hitachi High-Technologies Corporation
Kazuyuki Kakuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIFFRACTION GRATING MANUFACTURING METHOD, SPECTROPHOTOMETER, AND SE...
Publication number
20140092384
Publication date
Apr 3, 2014
Hitachi High-Technologies Corporation
Yoshisada Ebata
G02 - OPTICS
Information
Patent Application
SPECTROPHOTOMETER
Publication number
20130222789
Publication date
Aug 29, 2013
Shigeru Matsui
G01 - MEASURING TESTING
Information
Patent Application
Spectrophotometer
Publication number
20020050560
Publication date
May 2, 2002
Kouhei Kabuki
G01 - MEASURING TESTING