Yoshitaka IWAKI

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Fujisawa-shi, Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspection device
- Patent number 11,714,120
- Issue date Aug 1, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor sample inspection device and inspection method
- Patent number 11,573,251
- Issue date Feb 7, 2023
- Hamamatsu Photonics K.K.
- Yoshitaka Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device
- Patent number 11,209,476
- Issue date Dec 28, 2021
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20220050137
- Publication date Feb 17, 2022
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR SAMPLE INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20210325435
- Publication date Oct 21, 2021
- Hamamatsu Photonics K.K.
- Yoshitaka IWAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20200110129
- Publication date Apr 9, 2020
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING