Yoshitaka Kayukawa

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and method for testing same
- Patent number 7,487,418
- Issue date Feb 3, 2009
- Sony Corporation
- Yoshitaka Kayukawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit and method for testing same
- Publication number 20040153801
- Publication date Aug 5, 2004
- Yoshitaka Kayukawa
- G01 - MEASURING TESTING